Eric N. Vella

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Correcting aberration and apodization of an optical system using co...
- Patent number 12,092,814
- Issue date Sep 17, 2024
- KLA Corporation
- Haifeng Huang
- G02 - OPTICS
Information Patent Grant
Apparatus and methods for measuring phase and amplitude of light th...
- Patent number 11,131,629
- Issue date Sep 28, 2021
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Grant
Techniques and systems for model-based critical dimension measurements
- Patent number 9,875,534
- Issue date Jan 23, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 7,012,683
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for optically inspecting a sample for anomalies
- Patent number 6,833,913
- Issue date Dec 21, 2004
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for scanning a beam of light across a specimen
- Patent number 6,775,051
- Issue date Aug 10, 2004
- KLA Tencor Technologies
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional UV compatible programmable spatial filter
- Patent number 6,686,995
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G01 - MEASURING TESTING
Information Patent Grant
UV compatible programmable spatial filter
- Patent number 6,686,994
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter Wilk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RECTANGULAR CUBOID, NON-POLARIZING BEAM SPLITTER THAT AVOIDS INTERF...
- Publication number 20240280828
- Publication date Aug 22, 2024
- KLA Corporation
- Haifeng Huang
- G02 - OPTICS
Information Patent Application
CORRECTING ABERRATION AND APODIZATION OF AN OPTICAL SYSTEM USING CO...
- Publication number 20220244530
- Publication date Aug 4, 2022
- Haifeng Huang
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHODS FOR MEASURING PHASE AND AMPLITUDE OF LIGHT TH...
- Publication number 20180340886
- Publication date Nov 29, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES AND SYSTEMS FOR MODEL-BASED CRITICAL DIMENSION MEASUREMENTS
- Publication number 20170069080
- Publication date Mar 9, 2017
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and methods for optically inspecting a sample for anomalies
- Publication number 20050092899
- Publication date May 5, 2005
- KLA-Tencor Technologies Corporation
- Ralph C. Wolf
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER
- Publication number 20040001198
- Publication date Jan 1, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS
Information Patent Application
UV compatible programmable spatial filter
- Publication number 20030184739
- Publication date Oct 2, 2003
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS
Information Patent Application
Systems and methods for scanning a beam of light across a specimen
- Publication number 20020181119
- Publication date Dec 5, 2002
- Jamie Sullivan
- G01 - MEASURING TESTING

Eric N. Vella

Person

Patents Grantslast 30 patents

Correcting aberration and apodization of an optical system using co...

Apparatus and methods for measuring phase and amplitude of light th...

Techniques and systems for model-based critical dimension measurements

Apparatus and methods for optically inspecting a sample for anomalies

Apparatus and methods for optically inspecting a sample for anomalies

Systems and methods for scanning a beam of light across a specimen

Two-dimensional UV compatible programmable spatial filter

UV compatible programmable spatial filter

Patents Applicationslast 30 patents

RECTANGULAR CUBOID, NON-POLARIZING BEAM SPLITTER THAT AVOIDS INTERF...

CORRECTING ABERRATION AND APODIZATION OF AN OPTICAL SYSTEM USING CO...

APPARATUS AND METHODS FOR MEASURING PHASE AND AMPLITUDE OF LIGHT TH...

TECHNIQUES AND SYSTEMS FOR MODEL-BASED CRITICAL DIMENSION MEASUREMENTS

Apparatus and methods for optically inspecting a sample for anomalies

TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER

UV compatible programmable spatial filter

Systems and methods for scanning a beam of light across a specimen