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Eric O. Green
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for measuring performance of hierarchical test...
Patent number
8,301,412
Issue date
Oct 30, 2012
GLOBALFOUNDRIES Inc.
Eric O. Green
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for correlating test equipment health and test...
Patent number
7,788,065
Issue date
Aug 31, 2010
GLOBALFOUNDRIES Inc.
Elfido Coss, Jr.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for dynamically determining tester recipes
Patent number
7,774,670
Issue date
Aug 10, 2010
GLOBALFOUNDRIES Inc.
Richard J. Markle
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for matching test equipment calibration
Patent number
7,716,004
Issue date
May 11, 2010
Advanced Micro Devices, Inc.
Elfido Coss, Jr.
G01 - MEASURING TESTING
Information
Patent Grant
Determining the health of a desired node in a multi-level system
Patent number
7,246,290
Issue date
Jul 17, 2007
Advanced Micro Devices, Inc.
Eric O. Green
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and apparatus for system state classification
Patent number
7,065,422
Issue date
Jun 20, 2006
Advanced Micro Devices, Inc.
Eric O. Green
G05 - CONTROLLING REGULATING
Information
Patent Grant
Methods of controlling gate electrode doping, and systems for accom...
Patent number
7,033,873
Issue date
Apr 25, 2006
Advanced Micro Devices, Inc.
Pirainder Lall
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fault detection spanning multiple processes
Patent number
6,991,945
Issue date
Jan 31, 2006
Advanced Micro Devices, Inc.
Howard E. Castle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Advanced process control of the manufacture of an oxide-nitride-oxi...
Patent number
6,953,697
Issue date
Oct 11, 2005
Advanced Micro Devices, Inc.
Howard E. Castle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining a next tool state based on fault detection information
Patent number
6,912,433
Issue date
Jun 28, 2005
Advanced Mirco Devices, Inc.
Robert J. Chong
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Updating process controller based upon fault detection analysis
Patent number
6,871,114
Issue date
Mar 22, 2005
Eric O. Green
G05 - CONTROLLING REGULATING
Information
Patent Grant
Process control at an interconnect level
Patent number
6,842,661
Issue date
Jan 11, 2005
Advanced Micro Devices, Inc.
Robert J. Chong
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Process control based on tool health data
Patent number
6,804,619
Issue date
Oct 12, 2004
Advanced Micro Devices, Inc.
Robert J. Chong
G05 - CONTROLLING REGULATING
Information
Patent Grant
Determination of a process flow based upon fault detection analysis
Patent number
6,740,534
Issue date
May 25, 2004
Advanced Micro Devices, Inc.
Ernest D. Adams
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING PERFORMANCE OF HIERARCHICAL TEST...
Publication number
20100250191
Publication date
Sep 30, 2010
Eric O. Green
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DYNAMICALLY DETERMINING TESTER RECIPES
Publication number
20090070644
Publication date
Mar 12, 2009
RICHARD J. MARKLE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CORRELATING TEST EQUIPMENT HEALTH AND TEST...
Publication number
20090012737
Publication date
Jan 8, 2009
Elfido Coss, JR.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for matching test equipment calibration
Publication number
20090012730
Publication date
Jan 8, 2009
ELFIDO COSS, JR.
G01 - MEASURING TESTING
Information
Patent Application
Process control at an interconnect level
Publication number
20040064214
Publication date
Apr 1, 2004
Robert J. Chong
G05 - CONTROLLING REGULATING