Eric R. Harrington

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Topsfield, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for scanning a workpiece through an ion beam
- Patent number 7,608,843
- Issue date Oct 27, 2009
- TEL Epion Inc.
- Avrum Freytsis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR SCANNING A WORKPIECE THROUGH AN ION BEAM
- Publication number 20070262267
- Publication date Nov 15, 2007
- Epion Corporation
- Avrum Freytsis
- H01 - BASIC ELECTRIC ELEMENTS