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Eric Robert Christenson
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Tualatin, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe systems for optically probing a device under test and methods...
Patent number
11,131,709
Issue date
Sep 28, 2021
FormFactor, Inc.
Joseph George Frankel
G01 - MEASURING TESTING
Information
Patent Grant
Calibration chucks for optical probe systems, optical probe systems...
Patent number
11,047,795
Issue date
Jun 29, 2021
FormFactor, Inc.
Kazuki Negishi
G01 - MEASURING TESTING
Information
Patent Grant
Probe systems and methods for calibrating capacitive height sensing...
Patent number
10,809,048
Issue date
Oct 20, 2020
FormFactor Beaverton, Inc.
Kazuki Negishi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...
Publication number
20210132115
Publication date
May 6, 2021
FormFactor Beaverton, Inc.
Kazuki Negishi
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS...
Publication number
20210096176
Publication date
Apr 1, 2021
FormFactor Beaverton, Inc.
Joseph George Frankel
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...
Publication number
20200378888
Publication date
Dec 3, 2020
FormFactor Beaverton, Inc.
Kazuki Negishi
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING...
Publication number
20200217638
Publication date
Jul 9, 2020
FormFactor Beaverton, Inc.
Kazuki Negishi
G01 - MEASURING TESTING