Eric T. Fought

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Structural testing using boundary scan techniques
- Patent number 7,702,981
- Issue date Apr 20, 2010
- Intel Corporation
- James Grealish
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing an I/O buffer
- Patent number 6,889,350
- Issue date May 3, 2005
- Intel Corporation
- Eric T. Fought
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURAL TESTING USING BOUNDARY SCAN TECHNIQUES
- Publication number 20080244343
- Publication date Oct 2, 2008
- James Grealish
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing an I/O buffer
- Publication number 20030005374
- Publication date Jan 2, 2003
- Eric T. Fought
- G01 - MEASURING TESTING