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Eric TONNIS
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Bristol, GB
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last 30 patents
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Patent Grant
Semiconductor wafer mass metrology apparatus and semiconductor wafe...
Patent number
12,288,702
Issue date
Apr 29, 2025
Lam Research Corporation
Gregor Elliott
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
SEMICONDUCTOR WAFER MASS METROLOGY APPARATUS AND SEMICONDUCTOR WAFE...
Publication number
20210175102
Publication date
Jun 10, 2021
METRYX LIMITED
Gregor ELLIOTT
G01 - MEASURING TESTING