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Eric W. Hearn
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Wappingers Falls, NY, US
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last 30 patents
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Patent Grant
Method for reducing oxygen precipitation in silicon wafers
Patent number
4,432,809
Issue date
Feb 21, 1984
International Business Machines Corporation
Patrick W. Chye
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Technique for predicting oxygen precipitation in semiconductor wafers
Patent number
4,342,616
Issue date
Aug 3, 1982
International Business Machines Corporation
Brian J. Elliott
G01 - MEASURING TESTING
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Patent Grant
Impact sound stressing holding assembly
Patent number
4,140,002
Issue date
Feb 20, 1979
The United States of America as represented by the Secretary of the Air Force
James F. Francis
G01 - MEASURING TESTING