Eric Yeh-Wei Tseo

Person

Kirkland, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Context sensitive relational feature/measurement command menu displ...
- Patent number 10,990,075
- Issue date Apr 27, 2021
- Mitutoyo Corporation
- Frank Uwe Madsen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection program editing environment providing user defined colli...
- Patent number 10,254,113
- Issue date Apr 9, 2019
- Mitutoyo Corporation
- Dahai Yu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection program editing environment with simulation status and c...
- Patent number 9,952,586
- Issue date Apr 24, 2018
- Mitutoyo Corporation
- Dahai Yu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection program editing environment with editing environment aut...
- Patent number 9,646,425
- Issue date May 9, 2017
- Mitutoyo Corporation
- Dahai Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for programming workpiece feature inspection oper...
- Patent number 9,639,083
- Issue date May 2, 2017
- Mitutoyo Corporation
- Eric Yeh-Wei Tseo
- G05 - CONTROLLING REGULATING
Information Patent Grant
Head-mounted personal visual display apparatus with image generator...
- Patent number 6,369,952
- Issue date Apr 9, 2002
- i-O Display systems LLC
- Richard Dennis Rallison
- G02 - OPTICS
Information Patent Grant
Head-mounted personal visual display apparatus with image generator...
- Patent number 5,991,085
- Issue date Nov 23, 1999
- i-O Display systems LLC
- Richard Dennis Rallison
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
CONTEXT SENSITIVE RELATIONAL FEATURE/MEASUREMENT COMMAND MENU DISPL...
- Publication number 20180089360
- Publication date Mar 29, 2018
- MITUTOYO CORPORATION
- Frank Uwe Madsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION PROGRAM EDITING ENVIRONMENT PROVIDING USER DEFINED COLLI...
- Publication number 20170067737
- Publication date Mar 9, 2017
- MITUTOYO CORPORATION
- Dahai Yu
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION PROGRAM EDITING ENVIRONMENT WITH SIMULATION STATUS AND C...
- Publication number 20160299493
- Publication date Oct 13, 2016
- MITUTOYO CORPORATION
- Dahai Yu
- G05 - CONTROLLING REGULATING
Information Patent Application
INSPECTION PROGRAM EDITING ENVIRONMENT WITH EDITING ENVIRONMENT AUT...
- Publication number 20160300396
- Publication date Oct 13, 2016
- MITUTOYO CORPORATION
- Dahai Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PROGRAMMING WORKPIECE FEATURE INSPECTION OPER...
- Publication number 20150169790
- Publication date Jun 18, 2015
- MITUTOYO CORPORATION
- Eric Yeh-Wei Tseo
- G06 - COMPUTING CALCULATING COUNTING

Eric Yeh-Wei Tseo

Person

Patents Grantslast 30 patents

Context sensitive relational feature/measurement command menu displ...

Inspection program editing environment providing user defined colli...

Inspection program editing environment with simulation status and c...

Inspection program editing environment with editing environment aut...

System and method for programming workpiece feature inspection oper...

Head-mounted personal visual display apparatus with image generator...

Head-mounted personal visual display apparatus with image generator...

Patents Applicationslast 30 patents

CONTEXT SENSITIVE RELATIONAL FEATURE/MEASUREMENT COMMAND MENU DISPL...

INSPECTION PROGRAM EDITING ENVIRONMENT PROVIDING USER DEFINED COLLI...

INSPECTION PROGRAM EDITING ENVIRONMENT WITH SIMULATION STATUS AND C...

INSPECTION PROGRAM EDITING ENVIRONMENT WITH EDITING ENVIRONMENT AUT...

SYSTEM AND METHOD FOR PROGRAMMING WORKPIECE FEATURE INSPECTION OPER...