Erich Plies

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Antenna for nuclear magnetic resonance tomography
- Patent number 5,661,400
- Issue date Aug 26, 1997
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for removing ions from an electron beam
- Patent number 5,616,920
- Issue date Apr 1, 1997
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens for producing a radiation focus in the inside of a s...
- Patent number 5,247,392
- Issue date Sep 21, 1993
- Siemens Aktiengesellschaft
- Erich Plies
- G02 - OPTICS
Information Patent Grant
Particle beam apparatus having an immersion lens arranged in an int...
- Patent number 5,146,090
- Issue date Sep 8, 1992
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for investigating latch-up propagation in comp...
- Patent number 5,030,829
- Issue date Jul 9, 1991
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for investigating the latch-up propagation in...
- Patent number 5,012,100
- Issue date Apr 30, 1991
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam measuring instrument
- Patent number 4,963,823
- Issue date Oct 16, 1990
- Siemens Aktiengesellschaft
- Johann Otto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the indirect identification of the intensity distributio...
- Patent number 4,788,495
- Issue date Nov 29, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic-magnetic lens for particle beam apparatus
- Patent number 4,785,176
- Issue date Nov 15, 1988
- Siemens Aktiengesellschaft
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer lens for particle beam apparatus
- Patent number 4,769,543
- Issue date Sep 6, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic opposing field spectrometer for electron beam test me...
- Patent number 4,748,324
- Issue date May 31, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-abberation spectrometer objective with high secondary electron...
- Patent number 4,728,790
- Issue date Mar 1, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Scanning system for a particle beam scanning apparatus
- Patent number 4,684,808
- Issue date Aug 4, 1987
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection lens system for generating a beam of neutral particles o...
- Patent number 4,629,899
- Issue date Dec 16, 1986
- Siemens Aktiengesellschaft
- Erich Plies
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer objective for particle beam measurement technique
- Patent number 4,551,625
- Issue date Nov 5, 1985
- Siemens Aktiengesellschaft
- Burkhard Lischke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer objective having parallel objective fields and spectro...
- Patent number 4,540,885
- Issue date Sep 10, 1985
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical system with variable-shaped beam for generating an...
- Patent number 4,514,638
- Issue date Apr 30, 1985
- Siemens Aktiengesellschaft
- Burkhard Lischke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection structure for a corpuscular beam blanking system and met...
- Patent number 4,507,559
- Issue date Mar 26, 1985
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Opposing field spectrometer for electron beam mensuration technology
- Patent number 4,464,571
- Issue date Aug 7, 1984
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Corpuscular beam blanking system
- Patent number 4,439,685
- Issue date Mar 27, 1984
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High current electron source
- Patent number 4,393,308
- Issue date Jul 12, 1983
- Siemens Aktiengesellschaft
- Klaus Anger
- H01 - BASIC ELECTRIC ELEMENTS

Erich Plies

Person

Patents Grantslast 30 patents

Antenna for nuclear magnetic resonance tomography

Apparatus for removing ions from an electron beam

Objective lens for producing a radiation focus in the inside of a s...

Particle beam apparatus having an immersion lens arranged in an int...

Method and apparatus for investigating latch-up propagation in comp...

Method and apparatus for investigating the latch-up propagation in...

Electron beam measuring instrument

Method for the indirect identification of the intensity distributio...

Electrostatic-magnetic lens for particle beam apparatus

Spectrometer lens for particle beam apparatus

Electrostatic opposing field spectrometer for electron beam test me...

Low-abberation spectrometer objective with high secondary electron...

Scanning system for a particle beam scanning apparatus

Deflection lens system for generating a beam of neutral particles o...

Spectrometer objective for particle beam measurement technique

Spectrometer objective having parallel objective fields and spectro...

Electron-optical system with variable-shaped beam for generating an...

Deflection structure for a corpuscular beam blanking system and met...

Opposing field spectrometer for electron beam mensuration technology

Corpuscular beam blanking system

High current electron source