Erich Schuster

Person

Huttenberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device for automatically determining the deviation between the stru...
- Patent number 4,796,999
- Issue date Jan 10, 1989
- Ernst Leitz Wetzlar GmbH
- Erich Schuster
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and arrangement for aligning, examining and/or measuring two...
- Patent number 4,758,731
- Issue date Jul 19, 1988
- Ernst Leitz Wetzlar GmbH
- Erich Schuster
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Rapid change holder for probe pins
- Patent number 4,738,033
- Issue date Apr 19, 1988
- Ernst Leitz Wetzlar GmbH
- Wolfgang Ferber
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for sensing test values at test samples
- Patent number 4,455,755
- Issue date Jun 26, 1984
- Ernst Leitz Wetzlar GmbH
- Rainer Fritsche
- G01 - MEASURING TESTING
Information Patent Grant
Instrumentation for sensing the test values at test samples
- Patent number 4,364,180
- Issue date Dec 21, 1982
- Ernst Leitz Wetzlar GmbH
- Jorg Willhelm
- G01 - MEASURING TESTING
Information Patent Grant
Linear micrometer
- Patent number 4,308,666
- Issue date Jan 5, 1982
- Ernst Leitz Wetzlar GmbH
- Herbert Hahn
- G01 - MEASURING TESTING
Information Patent Grant
Two-coordinate length measuring device for microscopic instruments
- Patent number 4,188,119
- Issue date Feb 12, 1980
- Ernst Leitz Wetzlar GmbH
- Karl-Wilhelm Schenck
- G02 - OPTICS

Erich Schuster

Person

Patents Grantslast 30 patents

Device for automatically determining the deviation between the stru...

Method and arrangement for aligning, examining and/or measuring two...

Rapid change holder for probe pins

Apparatus for sensing test values at test samples

Instrumentation for sensing the test values at test samples

Linear micrometer

Two-coordinate length measuring device for microscopic instruments