Erik Essers

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle beam system
- Patent number 11,239,054
- Issue date Feb 1, 2022
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating a particle beam system
- Patent number 10,984,977
- Issue date Apr 20, 2021
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam particle beam system
- Patent number 10,854,423
- Issue date Dec 1, 2020
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the lens detection o...
- Patent number 10,068,744
- Issue date Sep 4, 2018
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 8,431,894
- Issue date Apr 30, 2013
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement for holding a particle beam apparatus
- Patent number 6,969,854
- Issue date Nov 29, 2005
- Carl Zeiss NTS GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy system, electron microscopy method and focusing...
- Patent number 6,949,744
- Issue date Sep 27, 2005
- Carl Zeiss NTS GmbH
- Michael Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for a scanning electron microscope with variable pressure...
- Patent number 6,707,041
- Issue date Mar 16, 2004
- Leo Elektronermikroskopie GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,590,210
- Issue date Jul 8, 2003
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240302542
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240304412
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM MICROSCOPE
- Publication number 20240304409
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20240304410
- Publication date Sep 12, 2024
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM COLUMN
- Publication number 20230065039
- Publication date Mar 2, 2023
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE, METHOD FOR OPERATING THE PARTICLE BEAM DEVICE...
- Publication number 20230065373
- Publication date Mar 2, 2023
- CARL ZEISS MICROSCOPY GMBH
- Björn Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM INCLUDING A MULTI-BEAM DEFLECTION DEVICE AND A...
- Publication number 20220277927
- Publication date Sep 1, 2022
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20210066037
- Publication date Mar 4, 2021
- Carl Zeiss MultiSEM GmbH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE BEAM SYSTEM
- Publication number 20200185185
- Publication date Jun 11, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM
- Publication number 20190259575
- Publication date Aug 22, 2019
- CARL ZEISS MICROSCOPY GMBH
- Yanko Sarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...
- Publication number 20170154752
- Publication date Jun 1, 2017
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device
- Publication number 20090039257
- Publication date Feb 12, 2009
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for variable pressure areas and an electron microscope com...
- Publication number 20050173644
- Publication date Aug 11, 2005
- Peter Gnauck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscopy system, electron microscopy method and focusing...
- Publication number 20050006582
- Publication date Jan 13, 2005
- LEO Elektronenmikroskopie GmbH
- Michael Steigerwald
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector for a scanning electron microscope with variable pressure...
- Publication number 20030010913
- Publication date Jan 16, 2003
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS

Erik Essers

Person

Patents Grantslast 30 patents

Charged particle optical apparatus for through-the-lens detection o...

Multi-beam particle beam system

Particle beam system and method for operating a particle beam system

Charged particle optical apparatus for through-the-lens detection o...

Multi-beam particle beam system

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the lens detection o...

Charged particle optical apparatus having a selectively positionabl...

Electron beam device

Arrangement for holding a particle beam apparatus

Electron microscopy system, electron microscopy method and focusing...

Detector for a scanning electron microscope with variable pressure...

Scanning electron microscope

Patents Applicationslast 30 patents

PARTICLE BEAM MICROSCOPE

PARTICLE BEAM MICROSCOPE

PARTICLE BEAM MICROSCOPE

ELECTRON BEAM MICROSCOPE

PARTICLE BEAM COLUMN

PARTICLE BEAM DEVICE, METHOD FOR OPERATING THE PARTICLE BEAM DEVICE...

PARTICLE BEAM SYSTEM INCLUDING A MULTI-BEAM DEFLECTION DEVICE AND A...

MULTI-BEAM PARTICLE BEAM SYSTEM

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE BEAM SYSTEM

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

MULTI-BEAM PARTICLE BEAM SYSTEM

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...

Electron beam device

Detector for variable pressure areas and an electron microscope com...

Electron microscopy system, electron microscopy method and focusing...

Detector for a scanning electron microscope with variable pressure...