Erik GENTALEN

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Software for microfluidic systems interfacing with mass spectrometry
- Patent number 12,174,144
- Issue date Dec 24, 2024
- INTABIO, LLC
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for sample characterization
- Patent number 11,573,200
- Issue date Feb 7, 2023
- Intabio, LLC
- Erik Gentalen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Multichannel isoelectric focusing devices and high voltage power su...
- Patent number 11,285,484
- Issue date Mar 29, 2022
- Intabio, LLC
- Erik Gentalen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Isoelectric focusing devices and fixtures
- Patent number 11,224,875
- Issue date Jan 18, 2022
- INTABIO, LLC
- Eric Gwerder
- G01 - MEASURING TESTING
Information Patent Grant
Isoelectric focusing devices and fixtures
- Patent number 10,870,113
- Issue date Dec 22, 2020
- Intabio, Inc.
- Erik Gentalen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Devices, methods and kits for sample characterization
- Patent number 10,866,246
- Issue date Dec 15, 2020
- Intabio, Inc.
- Scott Mack
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Devices and methods for sample characterization
- Patent number 10,782,264
- Issue date Sep 22, 2020
- INTABIO, INC.
- Erik Gentalen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Devices, methods and kits for sample characterization
- Patent number 10,591,488
- Issue date Mar 17, 2020
- INTABIO, INC.
- Erik Gentalen
- G01 - MEASURING TESTING
Information Patent Grant
Software for microfluidic systems interfacing with mass spectrometry
- Patent number 10,514,360
- Issue date Dec 24, 2019
- INTABIO, INC.
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for sample characterization
- Patent number 10,401,324
- Issue date Sep 3, 2019
- INTABIO, INC.
- Erik Gentalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods for sample characterization
- Patent number 10,209,217
- Issue date Feb 19, 2019
- Intabio, Inc.
- Erik Gentalen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20240377359
- Publication date Nov 14, 2024
- INTABIO, LLC
- Luc Bousse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20230417703
- Publication date Dec 28, 2023
- INTABIO, LLC
- Wei CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOELECTRIC FOCUSING DEVICES AND FIXTURES
- Publication number 20230381781
- Publication date Nov 30, 2023
- INTABIO, LLC
- Luc BOUSSE
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20230213478
- Publication date Jul 6, 2023
- INTABIO, LLC
- Erik GENTALEN
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20230176009
- Publication date Jun 8, 2023
- INTABIO, LLC
- Erik GENTALEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20230010104
- Publication date Jan 12, 2023
- INTABIO, LLC
- Erik GENTALEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ISOELECTRIC FOCUSING DEVICES AND FIXTURES
- Publication number 20220088605
- Publication date Mar 24, 2022
- Intabio, Inc.
- Eric GWERDER
- G01 - MEASURING TESTING
Information Patent Application
DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION
- Publication number 20210223261
- Publication date Jul 22, 2021
- Intabio, Inc.
- Scott Mack
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20210181148
- Publication date Jun 17, 2021
- Intabio, Inc.
- Erik GENTALEN
- G01 - MEASURING TESTING
Information Patent Application
ISOELECTRIC FOCUSING DEVICES AND FIXTURES
- Publication number 20210101152
- Publication date Apr 8, 2021
- Intabio, Inc.
- Eric GWERDER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MULTICHANNEL ISOELECTRIC FOCUSING DEVICES AND HIGH VOLTAGE POWER SU...
- Publication number 20210046480
- Publication date Feb 18, 2021
- Intabio, Inc.
- Erik GENTALEN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION
- Publication number 20200191796
- Publication date Jun 18, 2020
- Intabio, Inc.
- Scott Mack
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20200110055
- Publication date Apr 9, 2020
- Intabio, Inc.
- Erik GENTALEN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20190369048
- Publication date Dec 5, 2019
- Intabio, Inc.
- Erik Gentalen
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY
- Publication number 20190369068
- Publication date Dec 5, 2019
- Intabio, Inc.
- Erik Gentalen
- G01 - MEASURING TESTING
Information Patent Application
DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION
- Publication number 20190234961
- Publication date Aug 1, 2019
- Intabio, Inc.
- Erik Gentalen
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20190128843
- Publication date May 2, 2019
- Intabio, Inc.
- Erik GENTALEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20180003674
- Publication date Jan 4, 2018
- Intabio, Inc.
- Erik GENTALEN
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION
- Publication number 20170176386
- Publication date Jun 22, 2017
- Intabio
- Erik GENTALEN
- G01 - MEASURING TESTING

Erik GENTALEN

Person

Patents Grantslast 30 patents

Software for microfluidic systems interfacing with mass spectrometry

Devices and methods for sample characterization

Multichannel isoelectric focusing devices and high voltage power su...

Isoelectric focusing devices and fixtures

Isoelectric focusing devices and fixtures

Devices, methods and kits for sample characterization

Devices and methods for sample characterization

Devices, methods and kits for sample characterization

Software for microfluidic systems interfacing with mass spectrometry

Devices and methods for sample characterization

Devices and methods for sample characterization

Patents Applicationslast 30 patents

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

ISOELECTRIC FOCUSING DEVICES AND FIXTURES

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

ISOELECTRIC FOCUSING DEVICES AND FIXTURES

DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

ISOELECTRIC FOCUSING DEVICES AND FIXTURES

MULTICHANNEL ISOELECTRIC FOCUSING DEVICES AND HIGH VOLTAGE POWER SU...

DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

SOFTWARE FOR MICROFLUIDIC SYSTEMS INTERFACING WITH MASS SPECTROMETRY

DEVICES, METHODS AND KITS FOR SAMPLE CHARACTERIZATION

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION

DEVICES AND METHODS FOR SAMPLE CHARACTERIZATION