Erik Jan Marinissen

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing of an integrated circuit that contains secret information
- Patent number 8,539,292
- Issue date Sep 17, 2013
- NXP B.V.
- André K. Nieuwland
- G01 - MEASURING TESTING
Information Patent Grant
Test access architecture and method of testing a module in an elect...
- Patent number 7,620,866
- Issue date Nov 17, 2009
- NXP B.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic test pattern generation
- Patent number 7,475,317
- Issue date Jan 6, 2009
- Koninklijke Philips Electronics N.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a memory
- Patent number 6,829,736
- Issue date Dec 7, 2004
- Koninklijke Philips Electronics N.V.
- Erik Jan Marinissen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing a memory array using compressed re...
- Patent number 6,721,911
- Issue date Apr 13, 2004
- Koninklijke Philips Electronics N.V.
- Erik J. Marinissen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for making a digital circuit testable via scan test
- Patent number 6,330,698
- Issue date Dec 11, 2001
- U.S. Philips Corporation
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Grant
Core test control
- Patent number 6,061,284
- Issue date May 9, 2000
- U.S. Philips Corporation
- Johannes D. Dingemanse
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100264932
- Publication date Oct 21, 2010
- NXP B.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100223515
- Publication date Sep 2, 2010
- NXP B.V.
- Andre Krijn Nieuwland
- G01 - MEASURING TESTING
Information Patent Application
Test architecture and method
- Publication number 20070208970
- Publication date Sep 6, 2007
- KONINKLIJKE PHILIPS ELECTRONCIS N.V.
- Erik J. Marinissen
- G01 - MEASURING TESTING
Information Patent Application
Automatic test pattern generation
- Publication number 20060259835
- Publication date Nov 16, 2006
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Application
Automatic test pattern generation
- Publication number 20060259842
- Publication date Nov 16, 2006
- Erik Jan Marinissen
- G01 - MEASURING TESTING