Erik JENSEN

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Optimizing a sequence of processes for manufacturing of product units
- Patent number 11,442,367
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method to change an etch parameter
- Patent number 11,300,887
- Issue date Apr 12, 2022
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 11,170,072
- Issue date Nov 9, 2021
- ASML Netherands B.V.
- Everhardus Cornelis Mos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing a sequence of processes for manufacturing of product units
- Patent number 11,106,141
- Issue date Aug 31, 2021
- ASML Netherlands B.V.
- Jochem Sebastiaan Wildenberg
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus to reduce effects of nonlinear behavior
- Patent number 11,036,146
- Issue date Jun 15, 2021
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus to correct for patterning process error
- Patent number 10,915,689
- Issue date Feb 9, 2021
- ASML Netherlands B.V.
- Peter Ten Berge
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to correct for patterning process error
- Patent number 10,691,863
- Issue date Jun 23, 2020
- ASML Netherlands B.V.
- Peter Ten Berge
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND AS...
- Publication number 20240152059
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Dogacan KARA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING A SAMPLING SCHEME, A SEMICONDUCTOR SUBSTRATE...
- Publication number 20220260920
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Pieter Gerardus Jacobus SMORENBERG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20220027437
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS
- Publication number 20210389684
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan Wildenberg
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS
- Publication number 20200026200
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Jochem Sebastiaan WILDENBERG
- G05 - CONTROLLING REGULATING
Information Patent Application
A METHOD TO CHANGE AN ETCH PARAMETER
- Publication number 20190285992
- Publication date Sep 19, 2019
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus VAN HAREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR
- Publication number 20180322237
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Peter TEN BERGE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO REDUCE EFFECTS OF NONLINEAR BEHAVIOR
- Publication number 20180314168
- Publication date Nov 1, 2018
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus VAN HAREN
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR
- Publication number 20180307135
- Publication date Oct 25, 2018
- ASML NETHERLANDS B.V.
- Peter TEN BERGE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20180067900
- Publication date Mar 8, 2018
- ASML NETHERLANDS B.V.
- Everhardus Cornelis MOS
- G06 - COMPUTING CALCULATING COUNTING

Erik JENSEN

Person

Patents Grantslast 30 patents

Optimizing a sequence of processes for manufacturing of product units

Method to change an etch parameter

Method and apparatus for inspection and metrology

Optimizing a sequence of processes for manufacturing of product units

Method and apparatus to reduce effects of nonlinear behavior

Method and apparatus to correct for patterning process error

Method and apparatus to correct for patterning process error

Patents Applicationslast 30 patents

A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND AS...

METHOD FOR DETERMINING A SAMPLING SCHEME, A SEMICONDUCTOR SUBSTRATE...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS

OPTIMIZING A SEQUENCE OF PROCESSES FOR MANUFACTURING OF PRODUCT UNITS

A METHOD TO CHANGE AN ETCH PARAMETER

METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR

METHOD AND APPARATUS TO REDUCE EFFECTS OF NONLINEAR BEHAVIOR

METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY