Erik Johan KOOP

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of measuring a parameter of a lithographic process, metrolog...
- Patent number 11,099,489
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G01 - MEASURING TESTING
Information Patent Grant
Methods for controlling lithographic apparatus, lithographic appara...
- Patent number 10,558,130
- Issue date Feb 11, 2020
- ASNL Netherlands B.V.
- Rene Marinus Gerardus Johan Queens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring a property of a substrate, inspection apparatus...
- Patent number 10,474,043
- Issue date Nov 12, 2019
- ASML Netherlands B.V.
- Patrick Warnaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for controlling lithographic apparatus, lithographic appara...
- Patent number 10,274,849
- Issue date Apr 30, 2019
- ASML Netherlands B.V.
- Rene Marinus Gerardus Johan Queens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Level sensor, a method for determining a height map of a substrate...
- Patent number 9,488,465
- Issue date Nov 8, 2016
- ASML Netherlands B.V.
- Laurent Khuat Duy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining exposure settings, lithographic exposure app...
- Patent number 8,208,118
- Issue date Jun 26, 2012
- ASML Netherlands B.V.
- David Warren Burry
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Method of Measuring a Parameter of a Lithographic Process, Metrolog...
- Publication number 20200192231
- Publication date Jun 18, 2020
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF DETERMINING A HEIGHT PROFILE, A MEASUREMENT SYSTEM AND...
- Publication number 20190294060
- Publication date Sep 26, 2019
- ASML Nethertands B.V.
- Arend Johannes DONKERBROEK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...
- Publication number 20190212664
- Publication date Jul 11, 2019
- ASML NETHERLANDS B.V.
- Rene Marinus Gerardus Johan QUEENS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...
- Publication number 20180210351
- Publication date Jul 26, 2018
- ASML NETHERLANDS B.V.
- Rene Marinus Gerardus Johan QUEENS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Measuring a Property of a Substrate, Inspection Apparatus...
- Publication number 20180173105
- Publication date Jun 21, 2018
- ASML NETHERLANDS B.V.
- Patrick Warnaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Level Sensor, a Method for Determining a Height Map of a Substrate,...
- Publication number 20130128247
- Publication date May 23, 2013
- ASML NETHERLANDS B.V.
- Laurent KHUAT DUY
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining Exposure Settings, Lithographic Exposure App...
- Publication number 20090201473
- Publication date Aug 13, 2009
- ASML NETHERLANDS B.V.
- David Warren BURRY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Erik Johan KOOP

Person

Patents Grantslast 30 patents

Method of measuring a parameter of a lithographic process, metrolog...

Methods for controlling lithographic apparatus, lithographic appara...

Method of measuring a property of a substrate, inspection apparatus...

Methods for controlling lithographic apparatus, lithographic appara...

Level sensor, a method for determining a height map of a substrate...

Method for determining exposure settings, lithographic exposure app...

Patents Applicationslast 30 patents

Method of Measuring a Parameter of a Lithographic Process, Metrolog...

A METHOD OF DETERMINING A HEIGHT PROFILE, A MEASUREMENT SYSTEM AND...

METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...

METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...

Method of Measuring a Property of a Substrate, Inspection Apparatus...

Level Sensor, a Method for Determining a Height Map of a Substrate,...

Method for Determining Exposure Settings, Lithographic Exposure App...