Erik Mejdal Lauridsen

Person

Haarlev, DK

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,288,570
- Issue date May 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
X-ray multigrain crystallography
- Patent number 10,139,357
- Issue date Nov 27, 2018
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory X-ray micro-tomography system with crystallographic grai...
- Patent number 9,383,324
- Issue date Jul 5, 2016
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,900
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet of Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
- Patent number 9,222,901
- Issue date Dec 29, 2015
- Danmarks Tekniske Universitet Anker Engelundsvej
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory x-ray micro-tomography system with crystallographic grai...
- Patent number 9,110,004
- Issue date Aug 18, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction contrast tomography (DCT) system, and X-ray diffr...
- Patent number 8,457,280
- Issue date Jun 4, 2013
- Danmarks Tekniske Universitet
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction contrast tomography (DCT) system, and an x-ray di...
- Patent number 8,385,503
- Issue date Feb 26, 2013
- Danmarks Tekniske Universitet
- Erik Mejdal Lauridsen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20190079032
- Publication date Mar 14, 2019
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MULTIGRAIN CRYSTALLOGRAPHY
- Publication number 20170038317
- Publication date Feb 9, 2017
- Xnovo Technology ApS
- Christian Wejdemann
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
- Publication number 20150316493
- Publication date Nov 5, 2015
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140307854
- Publication date Oct 16, 2014
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
- Publication number 20140254763
- Publication date Sep 11, 2014
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...
- Publication number 20140112433
- Publication date Apr 24, 2014
- Michael Feser
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) SYSTEM, AND X-RAY DIFFR...
- Publication number 20130101078
- Publication date Apr 25, 2013
- Danmarks Tekniske Universitet
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) SYSTEM, AND AN X-RAY DI...
- Publication number 20120008736
- Publication date Jan 12, 2012
- DANMARKS TEKNISKE UNIVERSITET
- Erik Mejdal LAURIDSEN
- G01 - MEASURING TESTING

Erik Mejdal Lauridsen

Person

Patents Grantslast 30 patents

X-ray multigrain crystallography

X-ray multigrain crystallography

Laboratory X-ray micro-tomography system with crystallographic grai...

X-ray diffraction method of mapping grain structures in a crystalli...

X-ray diffraction method of mapping grain structures in a crystalli...

Laboratory x-ray micro-tomography system with crystallographic grai...

X-ray diffraction contrast tomography (DCT) system, and X-ray diffr...

X-ray diffraction contrast tomography (DCT) system, and an x-ray di...

Patents Applicationslast 30 patents

Laboratory crystallographic x-ray diffraction analysis system

X-RAY MULTIGRAIN CRYSTALLOGRAPHY

X-RAY MULTIGRAIN CRYSTALLOGRAPHY

LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...

LABORATORY X-RAY MICRO-TOMOGRAPHY SYSTEM WITH CRYSTALLOGRAPHIC GRAI...

X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) SYSTEM, AND X-RAY DIFFR...

X-RAY DIFFRACTION CONTRAST TOMOGRAPHY (DCT) SYSTEM, AND AN X-RAY DI...