Erik Novak

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometry with pixelated color discriminating elements combine...
- Patent number 11,353,316
- Issue date Jun 7, 2022
- Onto Innovation Inc.
- Neal Brock
- G01 - MEASURING TESTING
Information Patent Grant
Single snap-shot fringe projection system
- Patent number 9,958,251
- Issue date May 1, 2018
- AD TECHNOLOGY CORPORATION
- Neal Brock
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement of lead angle of groove in manufactured part
- Patent number 9,752,868
- Issue date Sep 5, 2017
- Bruker Nano Inc.
- Erik Novak
- G05 - CONTROLLING REGULATING
Information Patent Grant
High-resolution in-line metrology for roll-to-roll processing opera...
- Patent number 9,746,316
- Issue date Aug 29, 2017
- 4D Technology Corporation
- Brad Kimbrough
- G01 - MEASURING TESTING
Information Patent Grant
Automated re-focusing of interferometric reference mirror
- Patent number 9,664,501
- Issue date May 30, 2017
- Bruker Nano Inc.
- Erik Novak
- G01 - MEASURING TESTING
Information Patent Grant
Signal sectioning for profiling printed-circuit-bord vias with vert...
- Patent number 9,664,509
- Issue date May 30, 2017
- Bruker Nano Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Automated re-focusing of interferometric reference mirror
- Patent number 9,234,814
- Issue date Jan 12, 2016
- Bruker Nano Inc.
- Erik Novak
- G01 - MEASURING TESTING
Information Patent Grant
Signal sectioning for profiling printed-circuit-board vias with ver...
- Patent number 8,953,171
- Issue date Feb 10, 2015
- Bruker Nano Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,482,741
- Issue date Jul 9, 2013
- Bruker Nano Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,416,425
- Issue date Apr 9, 2013
- Bruker Nano Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of non-homogeneous multi-material surfaces
- Patent number 8,213,021
- Issue date Jul 3, 2012
- Veeco Metrology, Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measurement of DLC layer on magnetic head
- Patent number 7,808,652
- Issue date Oct 5, 2010
- Veeco Instruments, Inc.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Grant
Variable-wavelength illumination system for interferometry
- Patent number 7,654,685
- Issue date Feb 2, 2010
- Veeco Instruments, Inc.
- Der-Shen Wan
- G01 - MEASURING TESTING
Information Patent Grant
Profilometry through dispersive medium using collimated light with...
- Patent number 7,375,821
- Issue date May 20, 2008
- Veeco Instruments, Inc.
- Sen Han
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of object deformation with optical profiler
- Patent number 7,283,250
- Issue date Oct 16, 2007
- Veeco Instruments, Inc.
- Joanna Schmit
- G01 - MEASURING TESTING
Information Patent Grant
Mounting mechanism for compensating optics in interferometer
- Patent number 7,212,356
- Issue date May 1, 2007
- Veeco Instruments Inc.
- Bryan W. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness and boundary characterization by interferometric pro...
- Patent number 7,119,909
- Issue date Oct 10, 2006
- Veeco Instruments, Inc.
- Paul R. Unruh
- G01 - MEASURING TESTING
Information Patent Grant
Centroid approach for estimating modulation peak in broad-bandwidth...
- Patent number 5,633,715
- Issue date May 27, 1997
- Wyko Corporation
- Chiayu Ai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART
- Publication number 20170023356
- Publication date Jan 26, 2017
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED RE-FOCUSING OF INTERFEROMETRIC REFERENCE MIRROR
- Publication number 20160123719
- Publication date May 5, 2016
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL SECTIONING FOR PROFILING PRINTED-CIRCUIT-BORD VIAS WITH VERT...
- Publication number 20150103357
- Publication date Apr 16, 2015
- JOANNA SCHMIT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257216
- Publication date Oct 11, 2012
- BRUKER NANO INC
- DONG CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES
- Publication number 20120257215
- Publication date Oct 11, 2012
- BRUKER NANO INC
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART
- Publication number 20120105864
- Publication date May 3, 2012
- BRUKER NANO INC
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of DLC layer on magnetic head
- Publication number 20090185193
- Publication date Jul 23, 2009
- VEECO INSTRUMENTS, INC.
- Florin Munteanu
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measurement of non-homogeneous multi-material surfaces
- Publication number 20090002775
- Publication date Jan 1, 2009
- VEECO INSTRUMENTS, INC.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Application
Variable-wavelength illumination system for interferometry
- Publication number 20080218999
- Publication date Sep 11, 2008
- VEECO INSTRUMENTS, INC.
- Der-Shen Wan
- G01 - MEASURING TESTING
Information Patent Application
Mounting mechanism for compensating optics in interferometer
- Publication number 20060120088
- Publication date Jun 8, 2006
- Bryan W. Guenther
- G01 - MEASURING TESTING
Information Patent Application
Profilometry through dispersive medium using collimated light with...
- Publication number 20060119862
- Publication date Jun 8, 2006
- Veeco Instruments, Inc.
- Sen Han
- G01 - MEASURING TESTING
Information Patent Application
Crystal detection with scattered-light illumination and autofocus
- Publication number 20060001954
- Publication date Jan 5, 2006
- Michael Wahl
- G02 - OPTICS
Information Patent Application
Film thickness and boundary characterization by interferometric pro...
- Publication number 20050280829
- Publication date Dec 22, 2005
- Paul R. Unruh
- G01 - MEASURING TESTING
Information Patent Application
Measurement of object deformation with optical profiler
- Publication number 20050157306
- Publication date Jul 21, 2005
- Joanna Schmit
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Interferometry with pixelated color discriminating elements combine...

Single snap-shot fringe projection system

Optical measurement of lead angle of groove in manufactured part

High-resolution in-line metrology for roll-to-roll processing opera...

Automated re-focusing of interferometric reference mirror

Signal sectioning for profiling printed-circuit-bord vias with vert...

Automated re-focusing of interferometric reference mirror

Signal sectioning for profiling printed-circuit-board vias with ver...

Interferometric measurement of non-homogeneous multi-material surfaces

Interferometric measurement of non-homogeneous multi-material surfaces

Interferometric measurement of non-homogeneous multi-material surfaces

Interferometric measurement of DLC layer on magnetic head

Variable-wavelength illumination system for interferometry

Profilometry through dispersive medium using collimated light with...

Measurement of object deformation with optical profiler

Mounting mechanism for compensating optics in interferometer

Film thickness and boundary characterization by interferometric pro...

Centroid approach for estimating modulation peak in broad-bandwidth...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART

AUTOMATED RE-FOCUSING OF INTERFEROMETRIC REFERENCE MIRROR

SIGNAL SECTIONING FOR PROFILING PRINTED-CIRCUIT-BORD VIAS WITH VERT...

INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES

INTERFEROMETRIC MEASUREMENT OF NON-HOMOGENEOUS MULTI-MATERIAL SURFACES

OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART

Interferometric measurement of DLC layer on magnetic head

Interferometric measurement of non-homogeneous multi-material surfaces

Variable-wavelength illumination system for interferometry

Mounting mechanism for compensating optics in interferometer

Profilometry through dispersive medium using collimated light with...

Crystal detection with scattered-light illumination and autofocus

Film thickness and boundary characterization by interferometric pro...

Measurement of object deformation with optical profiler