Erik Rene Kieft

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,961,709
- Issue date Apr 16, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coating on dielectric insert of a resonant RF cavity
- Patent number 11,328,892
- Issue date May 10, 2022
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slice depth reconstruction of charged particle images using model s...
- Patent number 11,282,670
- Issue date Mar 22, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for RF pulsed electron beam based STEM
- Patent number 11,127,562
- Issue date Sep 21, 2021
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging system for a catheter
- Patent number 11,116,940
- Issue date Sep 14, 2021
- Koninklijke Philips N.V.
- Daniel Simon Anna Ruijters
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Pulsed CFE electron source with fast blanker for ultrafast TEM appl...
- Patent number 11,114,272
- Issue date Sep 7, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron-beam imaging apparatus with improved performance
- Patent number 10,971,326
- Issue date Apr 6, 2021
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Studying dynamic specimens in a transmission charged particle micro...
- Patent number 10,825,648
- Issue date Nov 3, 2020
- FEI Company
- Bastiaan Lambertus Martinus Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Studying dynamic specimen behavior in a charged-particle microscope
- Patent number 10,340,113
- Issue date Jul 2, 2019
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ROI painting
- Patent number 10,039,518
- Issue date Aug 7, 2018
- Koninklijke Philips N.V.
- Erik Rene Kieft
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Time-resolved charged particle microscopy
- Patent number 10,032,599
- Issue date Jul 24, 2018
- FEI Cmnpany
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight charged particle spectroscopy
- Patent number 9,984,852
- Issue date May 29, 2018
- FEI Company
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Doctor aware automatic collimation
- Patent number 9,724,052
- Issue date Aug 8, 2017
- Koninklijke Philips N.V.
- Erik René Kieft
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Beam pulsing device for use in charged-particle microscopy
- Patent number 9,048,060
- Issue date Jun 2, 2015
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time domain multiplexing for imaging using time delay and integrati...
- Patent number 8,446,502
- Issue date May 21, 2013
- Koninklijke Philips Electronics N.V.
- Erik Rene Kieft
- G01 - MEASURING TESTING
Information Patent Grant
Radiation source, lithographic apparatus and device manufacturing m...
- Patent number 7,528,395
- Issue date May 5, 2009
- ASML Netherlands B.V.
- Konstantin Nikolaevitch Koshelev
- F28 - HEAT EXCHANGE IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20240006149
- Publication date Jan 4, 2024
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...
- Publication number 20210090846
- Publication date Mar 25, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATING ON DIELECTRIC INSERT OF A RESONANT RF CAVITY
- Publication number 20210043410
- Publication date Feb 11, 2021
- FEI Company
- Erik Rene Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20200273667
- Publication date Aug 27, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE
- Publication number 20200090899
- Publication date Mar 19, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STUDYING DYNAMIC SPECIMENS IN A TRANSMISSION CHARGED PARTICLE MICRO...
- Publication number 20190311882
- Publication date Oct 10, 2019
- FEI Comapny
- Bastiaan Lambertus Martinus Hendriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT CHARGED PARTICLE SPECTROSCOPY
- Publication number 20180151329
- Publication date May 31, 2018
- FEI Company
- Otger Jom Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-RESOLVED CHARGED PARTICLE MICROSCOPY
- Publication number 20180151326
- Publication date May 31, 2018
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STUDYING DYNAMIC SPECIMEN BEHAVIOR IN A CHARGED-PARTICLE MICROSCOPE
- Publication number 20170243713
- Publication date Aug 24, 2017
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROI PAINTING
- Publication number 20150272531
- Publication date Oct 1, 2015
- Erik Rene Kieft
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING SYSTEM FOR A CATHETER
- Publication number 20150250983
- Publication date Sep 10, 2015
- Koninklijke Philips N.V.
- Daniel Simon Anna Ruijters
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DOCTOR AWARE AUTOMATIC COLLIMATION
- Publication number 20150245804
- Publication date Sep 3, 2015
- Koninklijke Philips N.V.
- Erik René Kieft
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BEAM PULSING DEVICE FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140103225
- Publication date Apr 17, 2014
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME DOMAIN MULTIPLEXING FOR IMAGING USING TIME DELAY AND INTEGRATI...
- Publication number 20110317052
- Publication date Dec 29, 2011
- Koninklijke Philips Electronics N.V.
- Erik Rene Kieft
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring contamination of a surface of a com...
- Publication number 20040227102
- Publication date Nov 18, 2004
- ASML NETHERLANDS B.V.
- Ralph Kurt
- G01 - MEASURING TESTING
Information Patent Application
Radiation source, lithographic apparatus and device manufacturing m...
- Publication number 20040105082
- Publication date Jun 3, 2004
- ASML NETHERLANDS B.V.
- Konstantin Nikolaevitch Koshelev
- F28 - HEAT EXCHANGE IN GENERAL

Erik Rene Kieft

Person

Patents Grantslast 30 patents

Charged particle beam device for inspection of a specimen with a pl...

Coating on dielectric insert of a resonant RF cavity

Slice depth reconstruction of charged particle images using model s...

System and method for RF pulsed electron beam based STEM

X-ray imaging system for a catheter

Pulsed CFE electron source with fast blanker for ultrafast TEM appl...

Multi-electron-beam imaging apparatus with improved performance

Studying dynamic specimens in a transmission charged particle micro...

Studying dynamic specimen behavior in a charged-particle microscope

ROI painting

Time-resolved charged particle microscopy

Time-of-flight charged particle spectroscopy

Doctor aware automatic collimation

Beam pulsing device for use in charged-particle microscopy

Time domain multiplexing for imaging using time delay and integrati...

Radiation source, lithographic apparatus and device manufacturing m...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...

COATING ON DIELECTRIC INSERT OF A RESONANT RF CAVITY

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE

STUDYING DYNAMIC SPECIMENS IN A TRANSMISSION CHARGED PARTICLE MICRO...

TIME-OF-FLIGHT CHARGED PARTICLE SPECTROSCOPY

TIME-RESOLVED CHARGED PARTICLE MICROSCOPY

STUDYING DYNAMIC SPECIMEN BEHAVIOR IN A CHARGED-PARTICLE MICROSCOPE

ROI PAINTING

X-RAY IMAGING SYSTEM FOR A CATHETER

DOCTOR AWARE AUTOMATIC COLLIMATION

BEAM PULSING DEVICE FOR USE IN CHARGED-PARTICLE MICROSCOPY

TIME DOMAIN MULTIPLEXING FOR IMAGING USING TIME DELAY AND INTEGRATI...

Method and device for measuring contamination of a surface of a com...

Radiation source, lithographic apparatus and device manufacturing m...