Erik Sippel

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Tennenlohe, DE

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Patents Grantslast 30 patents

Information Patent Grant
Locating method for localizing at least one object using wave-based...
- Patent number 11,555,881
- Issue date Jan 17, 2023
- Friedrich-Alexander-Universitat Erlangen-Nurnberg
- Melanie Lipka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALIBRATING AT LEAST ONE SIGNAL AND/OR SYSTEM PARAMETER...
- Publication number 20240061078
- Publication date Feb 22, 2024
- Symeo GmbH
- Peter Gulden
- G01 - MEASURING TESTING
Information Patent Application
LOCATING METHOD FOR LOCALIZING AT LEAST ONE OBJECT USING WAVE-BASED...
- Publication number 20210389411
- Publication date Dec 16, 2021
- Friedrich-Alexander-Universitat Erlangen-Nurnberg
- Melanie Lipka
- G01 - MEASURING TESTING