Erika YE

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, systems, and methods for talbot spectrometers
- Patent number 10,732,044
- Issue date Aug 4, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for Talbot spectrometers
- Patent number 10,533,895
- Issue date Jan 14, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems, and methods for Talbot spectrometers
- Patent number 10,215,639
- Issue date Feb 26, 2019
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20200103281
- Publication date Apr 2, 2020
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20190323892
- Publication date Oct 24, 2019
- Massachusetts Institute of Technology
- Erika Ye
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEMS, AND METHODS FOR TALBOT SPECTROMETERS
- Publication number 20170059412
- Publication date Mar 2, 2017
- Erika YE
- G01 - MEASURING TESTING