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Erkan Acar
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Eugene, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Micro-coaxial wire interconnect architecture
Patent number
11,656,247
Issue date
May 23, 2023
Intel Corporation
Ronald Michael Kirby
G01 - MEASURING TESTING
Information
Patent Grant
Shielded interconnect array
Patent number
10,644,458
Issue date
May 5, 2020
Intel Corporation
Youngseok Oh
G01 - MEASURING TESTING
Information
Patent Grant
High density low cost wideband production RF test instrument archit...
Patent number
10,469,181
Issue date
Nov 5, 2019
Intel Corporation
Jin Pan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Microelectronic test device including a probe card having an interp...
Patent number
10,101,367
Issue date
Oct 16, 2018
Intel Corporation
Jin Pan
G01 - MEASURING TESTING
Information
Patent Grant
Space transformation methods
Patent number
10,101,381
Issue date
Oct 16, 2018
Intel Corporation
Erkan Acar
G01 - MEASURING TESTING
Information
Patent Grant
Organic space transformer attachment and assembly
Patent number
9,581,639
Issue date
Feb 28, 2017
Intel Corporation
Jin Yang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICRO-COAXIAL WIRE INTERCONNECT ARCHITECTURE
Publication number
20200141979
Publication date
May 7, 2020
Intel Corporation
Ronald Michael Kirby
G01 - MEASURING TESTING
Information
Patent Application
STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...
Publication number
20190293707
Publication date
Sep 26, 2019
Intel Corporation
Erkan ACAR
G01 - MEASURING TESTING
Information
Patent Application
HIGH DENSITY LOW COST WIDEBAND PRODUCTION RF TEST INSTRUMENT ARCHIT...
Publication number
20180351662
Publication date
Dec 6, 2018
Jin Pan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SHIELDED INTERCONNECT ARRAY
Publication number
20180287305
Publication date
Oct 4, 2018
Intel Corporation
Youngseok Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...
Publication number
20180188288
Publication date
Jul 5, 2018
Intel Corporation
Erkan Acar
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTRONIC TEST DEVICE INCLUDING A PROBE CARD HAVING AN INTERP...
Publication number
20160299174
Publication date
Oct 13, 2016
Intel Corporation
Jin Pan
G01 - MEASURING TESTING
Information
Patent Application
ORGANIC SPACE TRANSFORMER ATTACHMENT AND ASSEMBLY
Publication number
20150185252
Publication date
Jul 2, 2015
Jin YANG
G01 - MEASURING TESTING
Information
Patent Application
Space Transformation Methods
Publication number
20140062522
Publication date
Mar 6, 2014
Erkan Acar
G01 - MEASURING TESTING