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Erkki Sakari Kiuru
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Patents Grants
last 30 patents
Information
Patent Grant
Method and circuit arrangement for compensating for rate dependent...
Patent number
7,193,216
Issue date
Mar 20, 2007
Oxford Instruments Analytical Oy
Erkki Sakari Kiuru
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Drift-type detector with limited noise level
Patent number
7,173,250
Issue date
Feb 6, 2007
Oxford Instruments Analtyical Oy
Erkki Sakari Kiuru
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector, arrangement and method for measuring radioactiv...
Patent number
6,967,329
Issue date
Nov 22, 2005
Oxford Instruments Analytical Oy
Heikki Johannes Sipilä
G01 - MEASURING TESTING
Information
Patent Grant
Pulse field metal detector with spaced, dual coil transmitter and r...
Patent number
4,605,898
Issue date
Aug 12, 1986
Outokumpu Oy
Kari T. J. Aittoniemi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing ore by means of gamma radiation
Patent number
4,520,267
Issue date
May 28, 1985
Outokumpu Oy
Heikki Sipila
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the determination of the average particle...
Patent number
4,412,451
Issue date
Nov 1, 1983
Outokumpu Oy
Seppo J. Uusitalo
G01 - MEASURING TESTING
Information
Patent Grant
Method of improving the temperature stability of a voltage source,...
Patent number
4,114,085
Issue date
Sep 12, 1978
Outokumpu Oy, Ab.
Erkki Ilmari Leinonen
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
Method and circuit arrangement for compensating for rate dependent...
Publication number
20060086906
Publication date
Apr 27, 2006
Erkki Sakari Kiuru
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Drift-type detector with limited noise level
Publication number
20050285018
Publication date
Dec 29, 2005
Erkki Sakari Kiuru
G01 - MEASURING TESTING
Information
Patent Application
Radiation detector, arrangement and method for measuring radioactiv...
Publication number
20030138075
Publication date
Jul 24, 2003
Metorex International Oy
Heikki Johannes Sipila
G01 - MEASURING TESTING