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Erkki Tapani Puusaari
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Espoo, FI
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for protecting a radiation window
Patent number
9,182,362
Issue date
Nov 10, 2015
Bruker AXS Handheld, Inc.
Esko Juhani Kantonen
G01 - MEASURING TESTING
Information
Patent Grant
Compensation for fluctuations over time in the radiation characteri...
Patent number
7,474,730
Issue date
Jan 6, 2009
Oxford Instruments Analytical Oy
Erkki Tapani Puusaari
G01 - MEASURING TESTING
Information
Patent Grant
X-ray fluorescence analyzer having means for producing lowered pres...
Patent number
7,409,037
Issue date
Aug 5, 2008
Oxford Instruments Analytical Oy
Erkki Tapani Puusaari
G01 - MEASURING TESTING
Information
Patent Grant
X-ray tube of the end window type, and an X-ray fluorescence analyzer
Patent number
7,203,283
Issue date
Apr 10, 2007
Oxford Instruments Analytical Oy
Erkki Tapani Puusaari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adapter and analyzer device for performing X-ray fluorescence analy...
Patent number
7,020,238
Issue date
Mar 28, 2006
Oxford Instruments Analytical Oy
Esko Juhani Kantonen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR PROTECTING A RADIATION WINDOW
Publication number
20130279654
Publication date
Oct 24, 2013
BRUKER AXS HANDHELD, INC.
Esko Juhani Kantonen
G01 - MEASURING TESTING
Information
Patent Application
Compensation for fluctuations over time in the radiation characteri...
Publication number
20080095309
Publication date
Apr 24, 2008
Oxford Instruments Analytical Oy.
Erkki Tapani Puusaari
G01 - MEASURING TESTING
Information
Patent Application
X-ray fluorescence analyzer having means for producing lowered pres...
Publication number
20070269003
Publication date
Nov 22, 2007
Oxford Instruments Analytical Oy.
Erkki Tapani Puusaari
G01 - MEASURING TESTING