Ernest Beauel Hanks

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
RF metrology system for a substrate processing apparatus incorporat...
- Patent number 10,432,248
- Issue date Oct 1, 2019
- Lam Research Corporation
- Ernest Beauel Hanks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RF detector with double balanced linear mixer and corresponding met...
- Patent number 9,805,919
- Issue date Oct 31, 2017
- Lam Research Corporation
- Ernest Beauel Hanks
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RF METROLOGY SYSTEM FOR A SUBSTRATE PROCESSING APPARATUS INCORPORAT...
- Publication number 20190288737
- Publication date Sep 19, 2019
- LAM RESEARCH CORPORATION
- Ernest Beauel HANKS
- G06 - COMPUTING CALCULATING COUNTING