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Ernest K. Lewis
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Pearland, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
11,391,681
Issue date
Jul 19, 2022
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
10,876,982
Issue date
Dec 29, 2020
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
10,446,383
Issue date
Oct 15, 2019
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
9,297,761
Issue date
Mar 29, 2016
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nonoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
8,614,416
Issue date
Dec 24, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
Patent number
8,558,168
Issue date
Oct 15, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
Patent number
8,384,023
Issue date
Feb 26, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20220404298
Publication date
Dec 22, 2022
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20210116402
Publication date
Apr 22, 2021
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20200013606
Publication date
Jan 9, 2020
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20170221691
Publication date
Aug 3, 2017
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20160189942
Publication date
Jun 30, 2016
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
Publication number
20140084153
Publication date
Mar 27, 2014
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
POST-IONIZATION OF NEUTRALS FOR ION MOBILITY oTOFMS IDENTIFICATION...
Publication number
20130134305
Publication date
May 30, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
Publication number
20120018630
Publication date
Jan 26, 2012
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
POST-IONIZATION OF NEUTRALS FOR ION MOBILITY OTOFMS IDENTIFICATION...
Publication number
20100200742
Publication date
Aug 12, 2010
J. Albert Schultz
G01 - MEASURING TESTING