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Ernest P. Walker
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Weston, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Calibrating jitter
Patent number
7,991,046
Issue date
Aug 2, 2011
Teradyne, Inc.
Ronald A. Sartschev
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Strobe technique for test of digital signal timing
Patent number
7,856,578
Issue date
Dec 21, 2010
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Grant
Strobe technique for recovering a clock in a digital signal
Patent number
7,573,957
Issue date
Aug 11, 2009
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Grant
Strobe technique for time stamping a digital signal
Patent number
7,574,632
Issue date
Aug 11, 2009
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring test signals for semiconductor dev...
Patent number
7,508,228
Issue date
Mar 24, 2009
Teradyne, Inc.
Ernest P. Walker
G11 - INFORMATION STORAGE
Information
Patent Grant
Using parametric measurement units as a source of power for a devic...
Patent number
7,403,030
Issue date
Jul 22, 2008
Teradyne, Inc.
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Grant
Using a parametric measurement unit to sense a voltage at a device...
Patent number
7,271,610
Issue date
Sep 18, 2007
Teradyne, Inc.
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for testing semiconductor devices
Patent number
7,256,600
Issue date
Aug 14, 2007
Teradyne, Inc.
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for producing signals to test semiconductor devices
Patent number
7,135,881
Issue date
Nov 14, 2006
Teradyne, Inc.
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Grant
Pin electronics with high voltage functionality
Patent number
7,102,375
Issue date
Sep 5, 2006
Teradyne, Inc.
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Grant
Using a parametric measurement unit for converter testing
Patent number
7,023,366
Issue date
Apr 4, 2006
Teradyne, Inc.
Ernest Walker
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Temperature control structure
Patent number
6,448,575
Issue date
Sep 10, 2002
Teradyne, Inc.
Alexander H. Slocum
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low-cost configuration for monitoring and controlling parametric me...
Patent number
6,374,379
Issue date
Apr 16, 2002
Teradyne, Inc.
Ernest P. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Automatic test equipment using sigma delta modulation to create ref...
Patent number
6,282,682
Issue date
Aug 28, 2001
Teradyne, Inc.
Ernest P. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Test system for integrated circuits using a single memory for both...
Patent number
6,049,901
Issue date
Apr 11, 2000
Mary C. Stock
G01 - MEASURING TESTING
Information
Patent Grant
Automatic test equipment with pipelined sequencer
Patent number
5,657,486
Issue date
Aug 12, 1997
Teradyne, Inc.
Allen J. Czamara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic circuit tester control system
Patent number
4,816,750
Issue date
Mar 28, 1989
Teradyne, Inc.
Robert H. Van der Kloot
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATING JITTER
Publication number
20080285636
Publication date
Nov 20, 2008
Teradyne, Inc.
Ronald A. Sartschev
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Strobe technique for recovering a clock in a digital signal
Publication number
20070126487
Publication date
Jun 7, 2007
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Application
Strobe technique for test of digital signal timing
Publication number
20070091991
Publication date
Apr 26, 2007
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Application
Strobe technique for time stamping a digital signal
Publication number
20070071080
Publication date
Mar 29, 2007
Teradyne, Inc.
Ronald A. Sartschev
G01 - MEASURING TESTING
Information
Patent Application
Method and system for monitoring test signals for semiconductor dev...
Publication number
20060279310
Publication date
Dec 14, 2006
Teradyne, Inc.
Ernest P. Walker
G01 - MEASURING TESTING
Information
Patent Application
PIN ELECTRONICS WITH HIGH VOLTAGE FUNCTIONALITY
Publication number
20060139048
Publication date
Jun 29, 2006
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Application
Using a parametric measurement unit to sense a voltage at a device...
Publication number
20060132164
Publication date
Jun 22, 2006
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Application
Method and system for producing signals to test semiconductor devices
Publication number
20060132166
Publication date
Jun 22, 2006
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Application
Using parametric measurement units as a source of power for a devic...
Publication number
20060132163
Publication date
Jun 22, 2006
Ernest Walker
G01 - MEASURING TESTING
Information
Patent Application
Method and system for testing semiconductor devices
Publication number
20060132165
Publication date
Jun 22, 2006
Ernest Walker
G01 - MEASURING TESTING