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Ernesto A. Corte
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La Jolla, CA, US
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last 30 patents
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Patent Grant
Self-contained, on-line, real-time bulk material analyzer
Patent number
4,582,992
Issue date
Apr 15, 1986
Gamma-Metrics
Thomas L. Atwell
G01 - MEASURING TESTING
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Patent Grant
Radiation flux measuring device
Patent number
4,001,590
Issue date
Jan 4, 1977
General Atomic Company
Ernesto Corte
G01 - MEASURING TESTING
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Patent Grant
Noise generator system having amplitude control
Patent number
3,944,945
Issue date
Mar 16, 1976
General Atomic Company
Ernesto Corte
H03 - BASIC ELECTRONIC CIRCUITRY