Buchholz, DE
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Patent Grant
METEK Meteorologische Messtechnik GmbH
Gerhard Peters
G01 - MEASURING TESTING
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Patent Grant
Ernst Brinkmeyer
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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Patent Grant
Technische Universität Hamburg-Harburg
Ernst Brinkmeyer
G01 - MEASURING TESTING
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Patent Grant
Agilent Technologies, Inc.
Jens Cierullies
G01 - MEASURING TESTING
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Patent Grant
U.S. Philips Corp.
Manfred H. Fuchs
G01 - MEASURING TESTING
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Patent Grant
U.S. Philips Corp.
Ernst Brinkmeyer
G02 - OPTICS
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Patent Grant
U.S. Philips Corp.
Ernst Brinkmeyer
G01 - MEASURING TESTING
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Patent Grant
U.S. Philips Corp.
Ernst Brinkmeyer
G02 - OPTICS
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Patent Application
METEK Meteorologische Messtechnik GmbH
Gerhard Peters
G01 - MEASURING TESTING
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Patent Application
Ernst BRINKMEYER
G01 - MEASURING TESTING
Information
Patent Application
Technische Universitat Hamburg-Harburg
Ernst Brinkmeyer
G01 - MEASURING TESTING
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Patent Application
AGILENT TECHNOLOGIES, INC.
Jens Cierullies
G01 - MEASURING TESTING
