Ervin T. Hill

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dielectric barrier at non-volatile memory tile edge
- Patent number 11,069,855
- Issue date Jul 20, 2021
- Intel Corporation
- Kevin L. Baker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,650,891
- Issue date May 12, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,403,359
- Issue date Sep 3, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,381,101
- Issue date Aug 13, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for improved flash cell characteristics
- Patent number 8,072,022
- Issue date Dec 6, 2011
- Intel Corporation
- Pranav Kalavade
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of semiconductor processing involving forming doped polysil...
- Patent number 7,943,463
- Issue date May 17, 2011
- Micron Technology, Inc.
- Anish Khandekar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing high density flash memory and high perform...
- Patent number 7,186,614
- Issue date Mar 6, 2007
- Intel Corporation
- Henry S. Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for self-aligned MOS patterning
- Patent number 7,153,780
- Issue date Dec 26, 2006
- Intel Corporation
- Ervin T. Hill
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIELECTRIC BARRIER AT NON-VOLATILE MEMORY TILE EDGE
- Publication number 20210296582
- Publication date Sep 23, 2021
- Intel Corporation
- Kevin L. BAKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC BARRIER AT NON-VOLATILE MEMORY TILE EDGE
- Publication number 20210005810
- Publication date Jan 7, 2021
- Intel Corporation
- Kevin L. BAKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190355418
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190341122
- Publication date Nov 7, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190189237
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190189209
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS OF SEMICONDUCTOR PROCESSING INVOLVING FORMING DOPED POLYSIL...
- Publication number 20100255664
- Publication date Oct 7, 2010
- Micron Technology, Inc.
- Anish Khandekar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and methods for improved flash cell characteristics
- Publication number 20100155807
- Publication date Jun 24, 2010
- Pranav Kalavade
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for self-aligned MOS patterning
- Publication number 20050215039
- Publication date Sep 29, 2005
- Ervin T. Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing high density flash memory and high perform...
- Publication number 20050098821
- Publication date May 12, 2005
- Henry S. Chao
- H01 - BASIC ELECTRIC ELEMENTS

Ervin T. Hill

Person

Patents Grantslast 30 patents

Dielectric barrier at non-volatile memory tile edge

Non-contact measurement of memory cell threshold voltage

Non-contact electron beam probing techniques and related structures

Non-contact electron beam probing techniques and related structures

Non-contact measurement of memory cell threshold voltage

Apparatus and methods for improved flash cell characteristics

Methods of semiconductor processing involving forming doped polysil...

Method for manufacturing high density flash memory and high perform...

Method and apparatus for self-aligned MOS patterning

Patents Applicationslast 30 patents

DIELECTRIC BARRIER AT NON-VOLATILE MEMORY TILE EDGE

DIELECTRIC BARRIER AT NON-VOLATILE MEMORY TILE EDGE

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

METHODS OF SEMICONDUCTOR PROCESSING INVOLVING FORMING DOPED POLYSIL...

Apparatus and methods for improved flash cell characteristics

Method and apparatus for self-aligned MOS patterning

Method for manufacturing high density flash memory and high perform...