Erwan Le Roy

Person

Newark, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for optical interference fringe based integrat...
- Patent number 7,884,024
- Issue date Feb 8, 2011
- DCG Systems, Inc.
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for optical interference fringe based integrat...
- Patent number 7,697,146
- Issue date Apr 13, 2010
- DCG Systems, Inc.
- Erwan Le Roy
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for the improvement of material/voltage contrast
- Patent number 7,488,937
- Issue date Feb 10, 2009
- Credence Systems Corp.
- Erwan Le Roy
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for integrated circuit backside navigation
- Patent number 7,135,123
- Issue date Nov 14, 2006
- Credence Systems Corporation
- Mark Alan Thompson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for addressing thickness variations of a trenc...
- Patent number 7,115,426
- Issue date Oct 3, 2006
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging integrated circuits with focused ion beam
- Patent number 7,036,109
- Issue date Apr 25, 2006
- Credence Systems Corporation
- Chun-Cheng Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining thickness of a semiconductor substrate at th...
- Patent number 6,955,930
- Issue date Oct 18, 2005
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for forming a cavity in a semiconductor substr...
- Patent number 6,855,622
- Issue date Feb 15, 2005
- NPTest, LLC
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...
- Publication number 20070293052
- Publication date Dec 20, 2007
- Credence Systems Corporation
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for the improvement of material/voltage contrast
- Publication number 20070087572
- Publication date Apr 19, 2007
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS

Erwan Le Roy

Person

Patents Grantslast 30 patents

Apparatus and method for optical interference fringe based integrat...

Apparatus and method for optical interference fringe based integrat...

Method and apparatus for the improvement of material/voltage contrast

Method and system for integrated circuit backside navigation

Method and apparatus for addressing thickness variations of a trenc...

Imaging integrated circuits with focused ion beam

Method for determining thickness of a semiconductor substrate at th...

Method and apparatus for forming a cavity in a semiconductor substr...

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR OPTICAL INTERFERENCE FRINGE BASED INTEGRAT...

Method and apparatus for the improvement of material/voltage contrast