Erwin Spanner

Person

Traunstein, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Optical position measuring device
- Patent number 9,733,068
- Issue date Aug 15, 2017
- Dr. Johannes Heidenhain GmbH
- Jörg Drescher
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 9,188,424
- Issue date Nov 17, 2015
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring arrangement
- Patent number 7,701,593
- Issue date Apr 20, 2010
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device for determining the position of two objec...
- Patent number 7,639,366
- Issue date Dec 29, 2009
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Optics system for an interferometer that uses a measuring mirror, a...
- Patent number 7,542,149
- Issue date Jun 2, 2009
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Device for position indication and detection of guidance errors
- Patent number 6,907,372
- Issue date Jun 14, 2005
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device with a beam splitter
- Patent number 6,535,290
- Issue date Mar 18, 2003
- Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system and method for operating a position measu...
- Patent number 6,265,992
- Issue date Jul 24, 2001
- Dr. Johannes Heidenhain GmbH
- Rainer Hagl
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system and method for operating a position measu...
- Patent number 6,097,318
- Issue date Aug 1, 2000
- Dr. Johannes Heidenhain GmbH
- Rainer Hagl
- G01 - MEASURING TESTING
Information Patent Grant
Optical position-measuring device having reference mark graduation...
- Patent number 5,977,539
- Issue date Nov 2, 1999
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Phase grating and method of producing phase grating
- Patent number 5,786,931
- Issue date Jul 28, 1998
- Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Linear encoder
- Patent number 5,711,084
- Issue date Jan 27, 1998
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Dual-beam interferometer with a phase grating
- Patent number 5,574,560
- Issue date Nov 12, 1996
- Dr. Johannes Heidenhain GmbH
- Andreas Franz
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric position measuring system with integral optical circu...
- Patent number 5,500,734
- Issue date Mar 19, 1996
- Dr. Johannes Heidenhain GmbH
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Grant
Polarizing interferometric displacement measuring arrangement
- Patent number 5,333,048
- Issue date Jul 26, 1994
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring apparatus and method of use thereof
- Patent number 5,206,704
- Issue date Apr 27, 1993
- Dr. Johannes Heidenhain GmbH
- Walter Huber
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring apparatus with reflection
- Patent number 5,079,418
- Issue date Jan 7, 1992
- Dr. Johannes Heidenhain GmbH
- Dieter Michel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Position Measuring Device
- Publication number 20150354944
- Publication date Dec 10, 2015
- DR. JOHANNES HEIDENHAN GMBH
- Jörg Drescher
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20140176962
- Publication date Jun 26, 2014
- Dr. Johannes Heidenhain Gmbh
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring arrangement
- Publication number 20080297809
- Publication date Dec 4, 2008
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Optics system for an interferometer
- Publication number 20070188767
- Publication date Aug 16, 2007
- Erwin Spanner
- G01 - MEASURING TESTING
Information Patent Application
Position-measuring device for determining the position of two objec...
- Publication number 20060262315
- Publication date Nov 23, 2006
- Erwin Spanner
- G01 - MEASURING TESTING

Erwin Spanner

Person

Patents Grantslast 30 patents

Optical position measuring device

Interferometer

Optical position measuring arrangement

Position-measuring device for determining the position of two objec...

Optics system for an interferometer that uses a measuring mirror, a...

Device for position indication and detection of guidance errors

Optical position measuring device with a beam splitter

Position measuring system and method for operating a position measu...

Position measuring system and method for operating a position measu...

Optical position-measuring device having reference mark graduation...

Phase grating and method of producing phase grating

Linear encoder

Dual-beam interferometer with a phase grating

Photoelectric position measuring system with integral optical circu...

Polarizing interferometric displacement measuring arrangement

Position measuring apparatus and method of use thereof

Position measuring apparatus with reflection

Patents Applicationslast 30 patents

Optical Position Measuring Device

Interferometer

Optical position measuring arrangement

Optics system for an interferometer

Position-measuring device for determining the position of two objec...