Erwin Thalmann

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Integrated memory and method for testing the memory
- Patent number 7,308,622
- Issue date Dec 11, 2007
- Infineon Technologies AG
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic component, tester device and method for calibrating a te...
- Patent number 6,882,139
- Issue date Apr 19, 2005
- Infineon Technologies AG
- Thomas Grebner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for controlling command sequences, and command control devic...
- Publication number 20050283258
- Publication date Dec 22, 2005
- Erwin Thalmann
- G05 - CONTROLLING REGULATING
Information Patent Application
Integrated memory and method for testing the memory
- Publication number 20040153910
- Publication date Aug 5, 2004
- Erwin Thalmann
- G11 - INFORMATION STORAGE
Information Patent Application
Method for testing wafers to be tested and calibration apparatus
- Publication number 20030076126
- Publication date Apr 24, 2003
- Thomas Grebner
- G01 - MEASURING TESTING
Information Patent Application
Electronic component, tester device and method for calibrating a te...
- Publication number 20030020488
- Publication date Jan 30, 2003
- Thomas Grebner
- G01 - MEASURING TESTING