Esen Salcin

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for co-located metrology
- Patent number 10,804,167
- Issue date Oct 13, 2020
- KLA-Tencor Corporation
- David Y. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single wavelength ellipsometry with improved spot size capability
- Patent number 9,574,992
- Issue date Feb 21, 2017
- KLA-Tencor Corporation
- Esen Salcin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods And Systems For Co-Located Metrology
- Publication number 20200243400
- Publication date Jul 30, 2020
- KLA-Tencor Corporation
- David Y. Wang
- G06 - COMPUTING CALCULATING COUNTING