Esko O. Mikkola

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Tucson, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable test structure for characterization of integrated circ...
- Patent number 10,082,535
- Issue date Sep 25, 2018
- Ridgetop Group, Inc.
- Esko O. Mikkola
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable test chip, system and method for characterization of i...
- Patent number 9,275,187
- Issue date Mar 1, 2016
- Ridgetop Group, Inc.
- Esko O. Mikkola
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE TEST STRUCTURE FOR CHARACTERIZATION OF INTEGRATED CIRC...
- Publication number 20160161548
- Publication date Jun 9, 2016
- RIDGETOP GROUP, INC.
- Esko O. Mikkola
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE TEST CHIP, SYSTEM AND METHOD FOR CHARACTERIZATION OF I...
- Publication number 20120245879
- Publication date Sep 27, 2012
- Ridgetop Group, Inc.
- Esko O. Mikkola
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL