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Etai LITTWIN
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Yavne, IL
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last 30 patents
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Patent Grant
Scatterometry method and system
Patent number
10,302,414
Issue date
May 28, 2019
Nova Measuring Instruments Ltd.
Gilad Wainreb
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SCATTEROMETRY METHOD AND SYSTEM
Publication number
20160076876
Publication date
Mar 17, 2016
NOVA MEASURING INSTRUMENTS LTD.
Gilad WAINREB
G01 - MEASURING TESTING