Etai LITTWIN

Person

  • Yavne, IL

Patents Grantslast 30 patents

  • Information Patent Grant

    Scatterometry method and system

    • Patent number 10,302,414
    • Issue date May 28, 2019
    • Nova Measuring Instruments Ltd.
    • Gilad Wainreb
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SCATTEROMETRY METHOD AND SYSTEM

    • Publication number 20160076876
    • Publication date Mar 17, 2016
    • NOVA MEASURING INSTRUMENTS LTD.
    • Gilad WAINREB
    • G01 - MEASURING TESTING