Etay Lavert

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining target feature focus in image-bas...
- Patent number 11,921,825
- Issue date Mar 5, 2024
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining target feature focus in image-bas...
- Patent number 11,556,738
- Issue date Jan 17, 2023
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...
- Publication number 20240020353
- Publication date Jan 18, 2024
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXTRA TALL TARGET METROLOGY
- Publication number 20230324809
- Publication date Oct 12, 2023
- Yoram Uziel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL METROLOGY UTILIZING SHORT-WAVE INFRARED WAVELENGTHS
- Publication number 20220291143
- Publication date Sep 15, 2022
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AMD METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...
- Publication number 20220108128
- Publication date Apr 7, 2022
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING