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Ethan Caughey
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Hillsboro, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Apparatuses and methods for monitoring health of probing u-bump clu...
Patent number
11,740,282
Issue date
Aug 29, 2023
Intel Corporation
Jagat Shakya
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Apparatuses and methods for mitigating sticking of units-under-test
Patent number
11,486,923
Issue date
Nov 1, 2022
Intel Corporation
Jagat Shakya
G01 - MEASURING TESTING
Information
Patent Grant
In die stepping sort
Patent number
10,429,439
Issue date
Oct 1, 2019
Intel Corporation
Dae-Woo Kim
G01 - MEASURING TESTING
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Patent Grant
Space transformation methods
Patent number
10,101,381
Issue date
Oct 16, 2018
Intel Corporation
Erkan Acar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MICROBUMP CLUSTER PROBING ARCHITECTURE FOR 2.5D AND 3D DIES
Publication number
20230314479
Publication date
Oct 5, 2023
Intel Corporation
Jagat SHAKYA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUSES AND METHODS FOR MITIGATING STICKING OF UNITS-UNDER-TEST
Publication number
20200182928
Publication date
Jun 11, 2020
Intel Corporation
Jagat Shakya
G01 - MEASURING TESTING
Information
Patent Application
IN DIE STEPPING SORT
Publication number
20180003765
Publication date
Jan 4, 2018
Dae-Woo Kim
G01 - MEASURING TESTING
Information
Patent Application
Space Transformation Methods
Publication number
20140062522
Publication date
Mar 6, 2014
Erkan Acar
G01 - MEASURING TESTING