Ethan Harrison Cannon

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Radiation hardened flip-flop circuit for mitigating single event tr...
- Patent number 11,601,119
- Issue date Mar 7, 2023
- The Boeing Company
- Salim A. Rabaa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Direct measurement test structures for measuring static random acce...
- Patent number 11,029,355
- Issue date Jun 8, 2021
- The Boeing Company
- Mark Yao
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method to ensure correct operation of an integrated c...
- Patent number 9,223,037
- Issue date Dec 29, 2015
- GLOBALFOUNDRIES Inc.
- Ethan H. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
In-line stacking of transistors for soft error rate hardening
- Patent number 9,165,917
- Issue date Oct 20, 2015
- GLOBALFOUNDRIES Inc.
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filtered radiation hardened flip flop with reduced power consumption
- Patent number 9,013,219
- Issue date Apr 21, 2015
- The Boeing Company
- Manuel F. Cabanas-Holmen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Single event transient and upset mitigation for silicon-on-insulato...
- Patent number 8,847,621
- Issue date Sep 30, 2014
- The Boeing Company
- Ethan Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Interleaved transient filter
- Patent number 8,754,701
- Issue date Jun 17, 2014
- The Boeing Company
- Ethan Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Array of alpha particle sensors
- Patent number 8,647,909
- Issue date Feb 11, 2014
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for hardening latches in SOI CMOS devices
- Patent number 8,354,858
- Issue date Jan 15, 2013
- International Business Machines Corporation
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Structure and method for improving storage latch susceptibility to...
- Patent number 8,300,452
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing radiation and cross-talk induced...
- Patent number 8,207,753
- Issue date Jun 26, 2012
- The Boeing Company
- Manuel F. Cabanas-Holmen
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip heater and methods for fabrication thereof and use thereof
- Patent number 8,138,573
- Issue date Mar 20, 2012
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench capacitor for SOI CMOS devices for soft error immunity
- Patent number 8,133,772
- Issue date Mar 13, 2012
- International Business Machines Corporation
- John E. Barth, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of alpha particle sensors
- Patent number 8,120,131
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reducing radiation and cross-talk induced...
- Patent number 8,054,099
- Issue date Nov 8, 2011
- The Boeing Company
- Manuel F. Cabanas-Holmen
- G11 - INFORMATION STORAGE
Information Patent Grant
Neutralization of trapped charge in a charge accumulation layer of...
- Patent number 8,035,200
- Issue date Oct 11, 2011
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep trench capacitor for SOI CMOS devices for soft error immunity
- Patent number 7,989,865
- Issue date Aug 2, 2011
- International Business Machines Corporation
- John Edward Barth, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for improving storage latch susceptibility to...
- Patent number 7,965,540
- Issue date Jun 21, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for semiconductor device having radiation hardened insulator...
- Patent number 7,943,482
- Issue date May 17, 2011
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating semiconductor device having radiation harden...
- Patent number 7,935,609
- Issue date May 3, 2011
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for hardening latches in SOI CMOS devices
- Patent number 7,888,959
- Issue date Feb 15, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for QCRIT measurement in bulk CMOS using a switched capacito...
- Patent number 7,881,135
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Design structure for alpha particle sensor in SOI technology and st...
- Patent number 7,875,854
- Issue date Jan 25, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device structures with a self-aligned damage layer and methods for...
- Patent number 7,795,679
- Issue date Sep 14, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor below the buried oxide of SOI CMOS technologies for prote...
- Patent number 7,791,169
- Issue date Sep 7, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soft error protection structure employing a deep trench
- Patent number 7,791,123
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Grant
Design structure incorporating a hybrid substrate
- Patent number 7,750,406
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Ethan Harrison Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for neutralizing trapped charge in a charge accumulation lay...
- Patent number 7,736,915
- Issue date Jun 15, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS storage devices configurable in high performance mode or radia...
- Patent number 7,719,887
- Issue date May 18, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip heater and methods for fabrication thereof and use thereof
- Patent number 7,704,847
- Issue date Apr 27, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RADIATION INDUCED ERROR DETECTION IN SOLID-STATE DEVICES
- Publication number 20240362112
- Publication date Oct 31, 2024
- The Boeing Company
- Mark Joseph Clemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION HARDENED FLIP-FLOP CIRCUIT FOR MITIGATING SINGLE EVENT TR...
- Publication number 20220200585
- Publication date Jun 23, 2022
- The Boeing Company
- Salim A. Rabaa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIRECT MEASUREMENT TEST STRUCTURES FOR MEASURING STATIC RANDOM ACCE...
- Publication number 20200319243
- Publication date Oct 8, 2020
- The Boeing Company
- Mark Yao
- G11 - INFORMATION STORAGE
Information Patent Application
Filtered Radiation Hardened Flip Flop with Reduced Power Consumption
- Publication number 20150070062
- Publication date Mar 12, 2015
- The Boeing Company
- Manuel F. Cabanas-Holmen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTERLEAVED TRANSIENT FILTER
- Publication number 20140132332
- Publication date May 15, 2014
- THE BOEING COMPANY
- Ethan CANNON
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRUCTURE AND METHOD TO ENSURE CORRECT OPERATION OF AN INTEGRATED C...
- Publication number 20140032135
- Publication date Jan 30, 2014
- International Business Machines Corporation
- ETHAN H. CANNON
- G01 - MEASURING TESTING
Information Patent Application
SINGLE EVENT TRANSIENT AND UPSET MITIGATION FOR SILICON-ON-INSULATO...
- Publication number 20140015564
- Publication date Jan 16, 2014
- Ethan Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ARRAY OF ALPHA PARTICLE SENSORS
- Publication number 20120122260
- Publication date May 17, 2012
- International Business Machines Corporation
- Ethan H. CANNON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED...
- Publication number 20110309856
- Publication date Dec 22, 2011
- The Boeing Company
- Manuel F. Cabanas-Holmen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEEP TRENCH CAPACITOR FOR SOI CMOS DEVICES FOR SOFT ERROR IMMUNITY
- Publication number 20110177660
- Publication date Jul 21, 2011
- International Business Machines Corporation
- John E. Barth, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR IMPROVING STORAGE LATCH SUSCEPTIBILITY TO...
- Publication number 20110163365
- Publication date Jul 7, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES
- Publication number 20110102042
- Publication date May 5, 2011
- International Business Machines Corporation
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED...
- Publication number 20110025372
- Publication date Feb 3, 2011
- The Boeing Company
- Manuel F. Cabanas-Holmen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
IN-LINE STACKING OF TRANSISTORS FOR SOFT ERROR RATE HARDENING
- Publication number 20100301446
- Publication date Dec 2, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacito...
- Publication number 20100271057
- Publication date Oct 28, 2010
- Ethan H. Cannon
- G01 - MEASURING TESTING
Information Patent Application
NEUTRALIZATION OF TRAPPED CHARGE IN A CHARGE ACCUMULATION LAYER OF...
- Publication number 20100237475
- Publication date Sep 23, 2010
- International Business Machines Corporation
- John M. Aitken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY OF ALPHA PARTICLE SENSORS
- Publication number 20100230772
- Publication date Sep 16, 2010
- International Business Machines Corporation
- Ethan H. CANNON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF
- Publication number 20100200953
- Publication date Aug 12, 2010
- International Business Machines Corporation
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH CAPACITOR FOR SOI CMOS DEVICES FOR SOFT ERROR IMMUNITY
- Publication number 20100052026
- Publication date Mar 4, 2010
- International Business Machines Corporation
- John Edward Barth, JR.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE HAVING RADIATION HARDEN...
- Publication number 20100035393
- Publication date Feb 11, 2010
- John M. AITKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING RADIATION HARDENED...
- Publication number 20100032795
- Publication date Feb 11, 2010
- John M. AITKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE STRUCTURES WITH A SELF-ALIGNED DAMAGE LAYER AND METHODS FOR...
- Publication number 20100019330
- Publication date Jan 28, 2010
- Ethan H. Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN STRUCTURE FOR ALPHA PARTICLE SENSOR IN SOI TECHNOLOGY AND ST...
- Publication number 20090250622
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Ethan H. CANNON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR IMPROVING STORAGE LATCH SUSCEPTIBILITY TO...
- Publication number 20090244954
- Publication date Oct 1, 2009
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SOFT ERROR PROTECTION STRUCTURE EMPLOYING A DEEP TRENCH
- Publication number 20090224304
- Publication date Sep 10, 2009
- International Business Machines Corporation
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES
- Publication number 20090134925
- Publication date May 28, 2009
- International Business Machines Corporation
- Ethan H. Cannon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MONITORING IONIZING RADIATION IN SILICON-ON INSULATOR INTEGRATED CI...
- Publication number 20090113357
- Publication date Apr 30, 2009
- Wagdi William Abadeer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CMOS STORAGE DEVICES CONFIGURABLE IN HIGH PERFORMANCE MODE OR RADIA...
- Publication number 20090059657
- Publication date Mar 5, 2009
- Ethan H. Cannon
- G11 - INFORMATION STORAGE
Information Patent Application
DIGITAL CIRCUITS HAVING ADDITIONAL CAPACITORS FOR ADDITIONAL STABILITY
- Publication number 20090001481
- Publication date Jan 1, 2009
- Ethan Harrison Cannon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hybrid Substrates and Methods for Forming Such Hybrid Substrates
- Publication number 20080258181
- Publication date Oct 23, 2008
- Ethan Harrison Cannon
- H01 - BASIC ELECTRIC ELEMENTS

Ethan Harrison Cannon

Person

Patents Grantslast 30 patents

Radiation hardened flip-flop circuit for mitigating single event tr...

Direct measurement test structures for measuring static random acce...

Structure and method to ensure correct operation of an integrated c...

In-line stacking of transistors for soft error rate hardening

Filtered radiation hardened flip flop with reduced power consumption

Single event transient and upset mitigation for silicon-on-insulato...

Interleaved transient filter

Array of alpha particle sensors

Apparatus and method for hardening latches in SOI CMOS devices

Structure and method for improving storage latch susceptibility to...

Method and apparatus for reducing radiation and cross-talk induced...

On-chip heater and methods for fabrication thereof and use thereof

Deep trench capacitor for SOI CMOS devices for soft error immunity

Array of alpha particle sensors

Method and apparatus for reducing radiation and cross-talk induced...

Neutralization of trapped charge in a charge accumulation layer of...

Deep trench capacitor for SOI CMOS devices for soft error immunity

Structure and method for improving storage latch susceptibility to...

Method for semiconductor device having radiation hardened insulator...

Method for fabricating semiconductor device having radiation harden...

Apparatus and method for hardening latches in SOI CMOS devices

Method for QCRIT measurement in bulk CMOS using a switched capacito...

Design structure for alpha particle sensor in SOI technology and st...

Device structures with a self-aligned damage layer and methods for...

Capacitor below the buried oxide of SOI CMOS technologies for prote...

Soft error protection structure employing a deep trench

Design structure incorporating a hybrid substrate

Method for neutralizing trapped charge in a charge accumulation lay...

CMOS storage devices configurable in high performance mode or radia...

On-chip heater and methods for fabrication thereof and use thereof

Patents Applicationslast 30 patents

RADIATION INDUCED ERROR DETECTION IN SOLID-STATE DEVICES

RADIATION HARDENED FLIP-FLOP CIRCUIT FOR MITIGATING SINGLE EVENT TR...

DIRECT MEASUREMENT TEST STRUCTURES FOR MEASURING STATIC RANDOM ACCE...

Filtered Radiation Hardened Flip Flop with Reduced Power Consumption

INTERLEAVED TRANSIENT FILTER

STRUCTURE AND METHOD TO ENSURE CORRECT OPERATION OF AN INTEGRATED C...

SINGLE EVENT TRANSIENT AND UPSET MITIGATION FOR SILICON-ON-INSULATO...

ARRAY OF ALPHA PARTICLE SENSORS

METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED...

DEEP TRENCH CAPACITOR FOR SOI CMOS DEVICES FOR SOFT ERROR IMMUNITY

STRUCTURE AND METHOD FOR IMPROVING STORAGE LATCH SUSCEPTIBILITY TO...

APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES

METHOD AND APPARATUS FOR REDUCING RADIATION AND CROSS-TALK INDUCED...

IN-LINE STACKING OF TRANSISTORS FOR SOFT ERROR RATE HARDENING

Method for Qcrit Measurement in Bulk CMOS Using a Switched Capacito...

NEUTRALIZATION OF TRAPPED CHARGE IN A CHARGE ACCUMULATION LAYER OF...

ARRAY OF ALPHA PARTICLE SENSORS

ON-CHIP HEATER AND METHODS FOR FABRICATION THEREOF AND USE THEREOF

DEEP TRENCH CAPACITOR FOR SOI CMOS DEVICES FOR SOFT ERROR IMMUNITY

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE HAVING RADIATION HARDEN...

DESIGN STRUCTURE FOR SEMICONDUCTOR DEVICE HAVING RADIATION HARDENED...

DEVICE STRUCTURES WITH A SELF-ALIGNED DAMAGE LAYER AND METHODS FOR...

DESIGN STRUCTURE FOR ALPHA PARTICLE SENSOR IN SOI TECHNOLOGY AND ST...

STRUCTURE AND METHOD FOR IMPROVING STORAGE LATCH SUSCEPTIBILITY TO...

SOFT ERROR PROTECTION STRUCTURE EMPLOYING A DEEP TRENCH

APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES

MONITORING IONIZING RADIATION IN SILICON-ON INSULATOR INTEGRATED CI...

CMOS STORAGE DEVICES CONFIGURABLE IN HIGH PERFORMANCE MODE OR RADIA...

DIGITAL CIRCUITS HAVING ADDITIONAL CAPACITORS FOR ADDITIONAL STABILITY

Hybrid Substrates and Methods for Forming Such Hybrid Substrates