Etienne Racine

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Blainville, CA

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Patents Grantslast 30 patents

Information Patent Grant
Test access architecture for stacked memory and logic dies
- Patent number 9,689,918
- Issue date Jun 27, 2017
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Test access architecture for multi-die circuits
- Patent number 9,389,944
- Issue date Jul 12, 2016
- Mentor Graphics Corporation
- Ronald Press
- G01 - MEASURING TESTING
Information Patent Grant
Test access architecture for stacked dies
- Patent number 9,389,945
- Issue date Jul 12, 2016
- Mentor Graphics Corporation
- Ronald Press
- G01 - MEASURING TESTING