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Etsuji Yamamoto
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Tachikawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analog to digital converter with voltage comparators that compare a...
Patent number
6,963,298
Issue date
Nov 8, 2005
Renesas Technology Corp.
Masanori Otsuka
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Medical treatment apparatus
Patent number
6,557,558
Issue date
May 6, 2003
Hitachi, Ltd.
Fujio Tajima
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
RF probe and inspection system using NMR using the same
Patent number
5,808,467
Issue date
Sep 15, 1998
Hitachi, Ltd.
Hisaaki Ochi
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting method and apparatus based on nuclear magnetic resonance...
Patent number
5,789,922
Issue date
Aug 4, 1998
Hitachi, Ltd.
Hisaaki Ochi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and apparatus using nuclear magnetic resonance
Patent number
5,754,047
Issue date
May 19, 1998
Hitachi Medical Corporation
Yukari Onodera
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the analysis of electromagnetics
Patent number
5,751,600
Issue date
May 12, 1998
Hitachi, Ltd.
Hisaaki Ochi
G01 - MEASURING TESTING
Information
Patent Grant
Fluid measurement method using nuclear magnetic resonance imaging a...
Patent number
5,684,398
Issue date
Nov 4, 1997
Hitachi Medical Corporation
Kenji Takiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and apparatus using nuclear magnetic resonance
Patent number
5,602,480
Issue date
Feb 11, 1997
Hitachi Medical Corporation
Yukari Onodera
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus using magnetic resonance
Patent number
5,600,245
Issue date
Feb 4, 1997
Hitachi, Ltd.
Etsuji Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-coil adopting a quadrature detection method applied theret...
Patent number
5,592,088
Issue date
Jan 7, 1997
Hitachi, Ltd.
Yoshikuni Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and inspection apparatus using nuclear magnetic r...
Patent number
5,572,124
Issue date
Nov 5, 1996
Hitachi, Ltd.
Yoshitaka Bito
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus and RF coil employed therein
Patent number
5,559,434
Issue date
Sep 24, 1996
Hitachi, Ltd.
Tetsuhiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Method for reducing artifacts in magnetic resonance imaging
Patent number
5,539,311
Issue date
Jul 23, 1996
Hitachi Medical Corporation
Kenji Takiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Pipelined analog-to-digital converter
Patent number
5,534,864
Issue date
Jul 9, 1996
Hitachi, Ltd.
Koichi Ono
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High-speed magnetic resonance imaging method
Patent number
5,528,145
Issue date
Jun 18, 1996
Hitachi, Ltd.
Satoshi Hirata
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus and RF coil employed therein
Patent number
5,510,714
Issue date
Apr 23, 1996
Hitachi, Ltd.
Tetsuhiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Image reconstruction method in nuclear magnetic resonance imaging a...
Patent number
5,502,384
Issue date
Mar 26, 1996
Hitachi, Ltd.
Chitose Nakaya
G01 - MEASURING TESTING
Information
Patent Grant
Ultra high-speed magnetic resonance imaging method and apparatus
Patent number
5,493,224
Issue date
Feb 20, 1996
Hitachi, Ltd.
Hidemi Shiono
G01 - MEASURING TESTING
Information
Patent Grant
RF probe for MRI
Patent number
5,489,847
Issue date
Feb 6, 1996
Hitachi, Ltd.
Takayuki Nabeshima
G01 - MEASURING TESTING
Information
Patent Grant
RF probe
Patent number
5,477,145
Issue date
Dec 19, 1995
Hitachi Medical Corporation
Tetsuhiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magentic resonance imaging apparatus
Patent number
5,465,719
Issue date
Nov 14, 1995
Hitachi, Ltd.
Hiroyuki Itagaki
G01 - MEASURING TESTING
Information
Patent Grant
Multiple-coil adopting a quadrature detection method applied theret...
Patent number
5,457,386
Issue date
Oct 10, 1995
Hitachi, Ltd.
Yoshikuni Matsunaga
G01 - MEASURING TESTING
Information
Patent Grant
RF probe for nuclear magnetic resonance imaging (MRI) devices
Patent number
5,453,692
Issue date
Sep 26, 1995
Hitachi, Ltd.
Tetsuhiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Active noise cancellation apparatus in MRI apparatus
Patent number
5,427,102
Issue date
Jun 27, 1995
Hitachi, Ltd.
Shin'ichi Shimode
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Grant
Method of magnetic resonance imaging
Patent number
5,394,872
Issue date
Mar 7, 1995
Hitachi, Ltd.
Kenji Takiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonanace inspection apparatus and its method
Patent number
5,384,536
Issue date
Jan 24, 1995
Hitachi, Ltd.
Yoshiki Murakami
G01 - MEASURING TESTING
Information
Patent Grant
Method for eliminating motional artifacts in magnetic resonance ima...
Patent number
5,382,902
Issue date
Jan 17, 1995
Hitachi, Ltd.
Yo Taniguchi
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and apparatus using nuclear magnetic resonance (NMR)
Patent number
5,371,465
Issue date
Dec 6, 1994
Hitachi, Ltd.
Yukari Onodera
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance apparatus
Patent number
5,280,246
Issue date
Jan 18, 1994
Hitachi, Ltd.
Tetsuhiko Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Flow imaging method using an MRI apparatus
Patent number
5,221,898
Issue date
Jun 22, 1993
Hitachi, Ltd.
Kenji Takiguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Analog to digital (AD) converter
Publication number
20030043066
Publication date
Mar 6, 2003
Hitachi, Ltd.
Masanori Otsuka
H03 - BASIC ELECTRONIC CIRCUITRY