Etsuko Asano

Person

Atsugi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, manufacturing method thereof, and measuring m...
- Patent number 9,261,554
- Issue date Feb 16, 2016
- Semiconductor Energy Laboratory Co., Ltd.
- Takuya Tsurume
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, manufacturing method thereof, and measuring m...
- Patent number 8,822,272
- Issue date Sep 2, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Takuya Tsurume
- G01 - MEASURING TESTING
Information Patent Grant
Memory device and manufacturing method of the same
- Patent number 8,114,719
- Issue date Feb 14, 2012
- Semiconductor Energy Laboratory Co., Ltd.
- Kiyoshi Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,714,367
- Issue date May 11, 2010
- Semiconductor Energy Laboratory Co., Ltd.
- Saishi Fujikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 7,567,882
- Issue date Jul 28, 2009
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method using a TEG, a method of manufacturing a semicond...
- Patent number 7,560,293
- Issue date Jul 14, 2009
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,521,368
- Issue date Apr 21, 2009
- Semiconductor Energy Laboratory Co., Ltd.
- Tetsuji Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for examining semiconductor apparatus and meth...
- Patent number 7,292,955
- Issue date Nov 6, 2007
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation method using a TEG, a method of manufacturing a semicond...
- Patent number 7,256,079
- Issue date Aug 14, 2007
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 7,231,310
- Issue date Jun 12, 2007
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,202,149
- Issue date Apr 10, 2007
- Semiconductor Energy Laboratory Co., Ltd.
- Saishi Fujikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 7,112,982
- Issue date Sep 26, 2006
- Semiconductor Energy Laboratory Co., Ltd.
- Tatsuya Honda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND MEASURING M...
- Publication number 20140368230
- Publication date Dec 18, 2014
- Takuya TSURUME
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device, Manufacturing Method Thereof, and Measuring M...
- Publication number 20080277660
- Publication date Nov 13, 2008
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Takuya Tsurume
- G01 - MEASURING TESTING
Information Patent Application
Memory Device and Manufacturing Method of the Same
- Publication number 20080211024
- Publication date Sep 4, 2008
- Semiconductor Energy Laboratory Co., Ltd.
- Kiyoshi Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Evaluation method using a TEG, a method of manufacturing a semicond...
- Publication number 20080026490
- Publication date Jan 31, 2008
- Etsuko Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Evaluating Semiconductor Device
- Publication number 20070228371
- Publication date Oct 4, 2007
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Etsuko Asano
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Device and Manufacturing Method Thereof
- Publication number 20070170513
- Publication date Jul 26, 2007
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Saishi Fujikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for evaluating semiconductor device
- Publication number 20050273290
- Publication date Dec 8, 2005
- Etsuko Asano
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20050250308
- Publication date Nov 10, 2005
- Semiconductor Energy Laboratory Co., Ltd.
- Tetsuji Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Evaluation method using a TEG, a method of manufacturing a semicond...
- Publication number 20050196883
- Publication date Sep 8, 2005
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20050133862
- Publication date Jun 23, 2005
- Saishi Fujikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for evaluating semiconductor device
- Publication number 20050024079
- Publication date Feb 3, 2005
- Semiconductor Energy Laboratory Co., Ltd.
- Tatsuya Honda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for examining semiconductor apparatus and meth...
- Publication number 20030204820
- Publication date Oct 30, 2003
- Semiconductor Energy Laboratory Co., Ltd.
- Etsuko Asano
- G01 - MEASURING TESTING

Etsuko Asano

Person

Patents Grantslast 30 patents

Semiconductor device, manufacturing method thereof, and measuring m...

Semiconductor device, manufacturing method thereof, and measuring m...

Memory device and manufacturing method of the same

Semiconductor device and manufacturing method thereof

Method for evaluating semiconductor device

Evaluation method using a TEG, a method of manufacturing a semicond...

Method for manufacturing semiconductor device

Method and apparatus for examining semiconductor apparatus and meth...

Evaluation method using a TEG, a method of manufacturing a semicond...

Method for evaluating semiconductor device

Semiconductor device and manufacturing method thereof

Method for evaluating semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND MEASURING M...

Semiconductor Device, Manufacturing Method Thereof, and Measuring M...

Memory Device and Manufacturing Method of the Same

Evaluation method using a TEG, a method of manufacturing a semicond...

Method for Evaluating Semiconductor Device

Semiconductor Device and Manufacturing Method Thereof

Method for evaluating semiconductor device

Method for manufacturing semiconductor device

Evaluation method using a TEG, a method of manufacturing a semicond...

Semiconductor device and manufacturing method thereof

Method for evaluating semiconductor device

Method and apparatus for examining semiconductor apparatus and meth...