Etsuko Takane

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Yokohama, JP

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Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIR...
- Publication number 20110281380
- Publication date Nov 17, 2011
- Renesas Electronics Corporation
- Yasunori NARIZUKA
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM PROBE SHEET AND SEMICONDUCTOR CHIP INSPECTION SYSTEM
- Publication number 20110014727
- Publication date Jan 20, 2011
- Akira Yabushita
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM PROBE SHEET AND METHOD OF MANUFACTURING THE SAME, PROBE C...
- Publication number 20100301884
- Publication date Dec 2, 2010
- Etsuko Takane
- G01 - MEASURING TESTING
Information Patent Application
Thin film probe sheet and semiconductor chip inspection system
- Publication number 20060094162
- Publication date May 4, 2006
- Akira Yabushita
- G01 - MEASURING TESTING
Information Patent Application
Connecting apparatus, semiconductor chip inspecting apparatus, and...
- Publication number 20060043593
- Publication date Mar 2, 2006
- Terutaka Mori
- G01 - MEASURING TESTING