Etsuyoshi Sakaguchi

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Ibaraki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Fluorescent X-ray analysis method and device
- Patent number 7,515,685
- Issue date Apr 7, 2009
- Panasonic Corporation
- Hiroshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analysis method and fluorescent x-ray analysis de...
- Patent number 7,382,855
- Issue date Jun 3, 2008
- Matsushita Electric Industrial Co., Ltd.
- Yoshiyuki Tani
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis method and fluorescent X-ray analysis ap...
- Patent number 7,170,970
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Yoshiyuki Tani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fluorescent X-Ray Analysis Method and Device
- Publication number 20080192888
- Publication date Aug 14, 2008
- Hiroshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-Ray Analysis Method and Fluorescent X-Ray Analysis De...
- Publication number 20070248211
- Publication date Oct 25, 2007
- Yoshiyuki Tani
- G01 - MEASURING TESTING
Information Patent Application
Fluorescent X-ray analysis method and fluorescent X-ray analysis ap...
- Publication number 20060029182
- Publication date Feb 9, 2006
- Yoshiyuki Tani
- G01 - MEASURING TESTING