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Eugen Igor Muehldorf
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Potomac, MD, US
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last 30 patents
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Patent Grant
Testing macros embedded in LSI chips
Patent number
4,225,957
Issue date
Sep 30, 1980
International Business Machines Corporation
Charles R. Doty
G01 - MEASURING TESTING
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Patent Grant
Method of level sensitive testing a functional logic system with em...
Patent number
4,074,851
Issue date
Feb 21, 1978
International Business Machines Corporation
Edward Baxter Eichelberger
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Apparatus and process for testing AC performance of LSI components
Patent number
4,058,767
Issue date
Nov 15, 1977
International Business Machines Corporation
Eugen I. Muehldorf
G01 - MEASURING TESTING
Information
Patent Grant
Time split array logic element and method of operation
Patent number
3,987,286
Issue date
Oct 19, 1976
International Business Machines Corporation
Eugen Igor Muehldorf
G01 - MEASURING TESTING