Eugene A. Delenia

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Morgan Hill, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integration of photon emission microscope and focused ion beam
- Patent number 7,245,133
- Issue date Jul 17, 2007
- Credence Systems Corporation
- Chun-Cheng Tsao
- G01 - MEASURING TESTING
Information Patent Grant
Imaging integrated circuits with focused ion beam
- Patent number 7,036,109
- Issue date Apr 25, 2006
- Credence Systems Corporation
- Chun-Cheng Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective etch for uniform metal trace exposure and milling using f...
- Patent number 7,029,595
- Issue date Apr 18, 2006
- Advanced Micro Devices, Inc.
- Xia (Susan) Li
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Integration of photon emission microscope and focused ion beam
- Publication number 20060012385
- Publication date Jan 19, 2006
- CREDENCE SYSTEMS CORPORATION
- Chun-Cheng Tsao
- G01 - MEASURING TESTING