Eugene Fukshansky

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring of thin dielectric layer properties on semi...
- Patent number 7,034,563
- Issue date Apr 25, 2006
- Ahbee 2, L.P., A California Limited Partnership
- Vitali Souchkov
- G01 - MEASURING TESTING
Information Patent Grant
Lid assembly for high temperature processing chamber
- Patent number 6,019,848
- Issue date Feb 1, 2000
- Applied Materials, Inc.
- Jonathan Frankel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Pressure responsive clamp for a processing chamber
- Patent number 6,012,600
- Issue date Jan 11, 2000
- Applied Materials, Inc.
- Thanh Pham
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL