Eugene Thomas Bullock

Follow

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for enhancing voltage contrast of a wafer
- Patent number 7,994,476
- Issue date Aug 9, 2011
- Applied Materials Israel, Ltd.
- Eugene T. Bullock
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for test structure inspection
- Patent number 7,902,849
- Issue date Mar 8, 2011
- Applied Materials Israel, Ltd.
- Eugene T. Bullock
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for voltage contrast analysis of a wafer using...
- Patent number 7,528,614
- Issue date May 5, 2009
- Applied Materials, Inc.
- Eugene Thomas Bullock
- G01 - MEASURING TESTING
Information Patent Grant
System and method for voltage contrast analysis of a wafer
- Patent number 7,183,546
- Issue date Feb 27, 2007
- Applied Materials, Israel, Ltd.
- Eugene Thomas Bullock
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Test Structure Inspection
- Publication number 20070267632
- Publication date Nov 22, 2007
- Eugene T. Bullock
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for voltage contrast analysis of a wafer using...
- Publication number 20060134810
- Publication date Jun 22, 2006
- Applied Materials Israel Ltd.
- Eugene Thomas Bullock
- G01 - MEASURING TESTING
Information Patent Application
System and method for voltage contrast analysis of a wafer
- Publication number 20060054816
- Publication date Mar 16, 2006
- Applied Materials Israel Ltd.
- Eugene Thomas Bullock
- G01 - MEASURING TESTING