Eugene Wang

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
SRAM write driver with improved drive strength
- Patent number 10,249,361
- Issue date Apr 2, 2019
- NVIDIA Corporation
- Eugene Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM write driver with improved drive strength
- Patent number 9,240,232
- Issue date Jan 19, 2016
- NVIDIA Corporation
- Eugene Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for calibrating measurement tools for semiconduct...
- Patent number 8,044,668
- Issue date Oct 25, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and structure for sample preparation for scanning electron m...
- Patent number 7,989,228
- Issue date Aug 2, 2011
- Semiconductor Manufacturing International (Shanghai) Corporation
- Xudong Wan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for yield similarity of semiconductor devices
- Patent number 7,831,409
- Issue date Nov 9, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for reliability similarity of semiconductor devices
- Patent number 7,447,610
- Issue date Nov 4, 2008
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for processing commonality of semiconductor devices
- Patent number 7,319,938
- Issue date Jan 15, 2008
- Semmiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for yield similarity of semiconductor devices
- Patent number 7,286,958
- Issue date Oct 23, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for yield similarity of semiconductor devices
- Patent number 7,024,334
- Issue date Apr 4, 2006
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for processing commonality of semiconductor devices
- Patent number 7,003,430
- Issue date Feb 21, 2006
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for processing stability of semiconductor devices
- Patent number 6,965,844
- Issue date Nov 15, 2005
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SRAM WRITE DRIVER WITH IMPROVED DRIVE STRENGTH
- Publication number 20150200006
- Publication date Jul 16, 2015
- NVIDIA Corporation
- Eugene WANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR YIELD SIMILARITY OF SEMICONDUCTOR DEVICES
- Publication number 20080221831
- Publication date Sep 11, 2008
- Semiconductor Manufacturing Intenational (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and structure for sample preparation for scanning electron m...
- Publication number 20070111518
- Publication date May 17, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Xudong Wan
- G01 - MEASURING TESTING
Information Patent Application
Method and system for reliability similarity of semiconductor devices
- Publication number 20070072315
- Publication date Mar 29, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and system for calibrating measurement tools for semiconduct...
- Publication number 20070013388
- Publication date Jan 18, 2007
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and system for processing commonality of semiconductor devices
- Publication number 20060247894
- Publication date Nov 2, 2006
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and system for yield similarity of semiconductor devices
- Publication number 20060217910
- Publication date Sep 28, 2006
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR YIELD SIMILARITY OF SEMICONDUCTOR DEVICES
- Publication number 20050278140
- Publication date Dec 15, 2005
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PROCESSING COMMONALITY OF SEMICONDUCTOR DEVICES
- Publication number 20050278141
- Publication date Dec 15, 2005
- Semiconductor Manufacturing International (Shanghai) Corporation
- Eugene Wang
- G05 - CONTROLLING REGULATING

Eugene Wang

Person

Patents Grantslast 30 patents

SRAM write driver with improved drive strength

SRAM write driver with improved drive strength

Method and system for calibrating measurement tools for semiconduct...

Method and structure for sample preparation for scanning electron m...

Method and system for yield similarity of semiconductor devices

Method and system for reliability similarity of semiconductor devices

Method and system for processing commonality of semiconductor devices

Method and system for yield similarity of semiconductor devices

Method and system for yield similarity of semiconductor devices

Method and system for processing commonality of semiconductor devices

Method and system for processing stability of semiconductor devices

Patents Applicationslast 30 patents

SRAM WRITE DRIVER WITH IMPROVED DRIVE STRENGTH

METHOD AND SYSTEM FOR YIELD SIMILARITY OF SEMICONDUCTOR DEVICES

Method and structure for sample preparation for scanning electron m...

Method and system for reliability similarity of semiconductor devices

Method and system for calibrating measurement tools for semiconduct...

Method and system for processing commonality of semiconductor devices

Method and system for yield similarity of semiconductor devices

METHOD AND SYSTEM FOR YIELD SIMILARITY OF SEMICONDUCTOR DEVICES

METHOD AND SYSTEM FOR PROCESSING COMMONALITY OF SEMICONDUCTOR DEVICES