Eun-Hee JEANG

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Paju-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting a defect on a substrate, apparatus for performi...
- Patent number 10,816,480
- Issue date Oct 27, 2020
- Samsung Electronics Co., Ltd.
- Eun-Hee Jeang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING UNIT AND SUBSTRATE TREATING APPARATUS INCLUDING THE SAME
- Publication number 20240184216
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Yoon Sang LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF DETECTING A DEFECT ON A SUBSTRATE, APPARATUS FOR PERFORMI...
- Publication number 20200088649
- Publication date Mar 19, 2020
- Samsung Electronics Co., Ltd.
- Eun-Hee JEANG
- G01 - MEASURING TESTING