Eun-Jo Byun

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Built off testing apparatus
- Patent number 8,674,718
- Issue date Mar 18, 2014
- Samsung Electronics Co., Ltd.
- Se-jang Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Test interface device, test system and optical interface memory device
- Patent number 8,606,102
- Issue date Dec 10, 2013
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device test apparatus including interface unit and me...
- Patent number 7,973,550
- Issue date Jul 5, 2011
- Samsung Electronics Co., Ltd.
- Eun-Jo Byun
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
BUILT OFF TESTING APPARATUS
- Publication number 20140139258
- Publication date May 22, 2014
- Samsung Electronics Co., Ltd.
- Se-jang OH
- G01 - MEASURING TESTING
Information Patent Application
BUILT OFF TESTING APPARATUS
- Publication number 20100289517
- Publication date Nov 18, 2010
- Samsung Electronics Co., Ltd.
- Se-jang OH
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TEST APPARATUS INCLUDING INTERFACE UNIT AND ME...
- Publication number 20100182035
- Publication date Jul 22, 2010
- Eun-Jo Byun
- G01 - MEASURING TESTING
Information Patent Application
Test interface device, test system and optical interface memory device
- Publication number 20100150549
- Publication date Jun 17, 2010
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Interface device for wireless testing, semiconductor device and sem...
- Publication number 20100025682
- Publication date Feb 4, 2010
- Samsung Electronics Co., Ltd.
- Sang-Hoon Lee
- G01 - MEASURING TESTING